{"title":"一种采用电荷分担抵消技术的9ghz低带内噪声子采样斩波锁相环","authors":"Xiangjian Kong;Kai Xu;Huanlin Xie;Mingchao Jian;Hao Lian;Robert Bogdan Staszewski;Chunbing Guo","doi":"10.1109/JSSC.2025.3532504","DOIUrl":null,"url":null,"abstract":"This article presents a low-jitter sub-sampling chopper phase-locked loop (SS-CPLL) that incorporates a novel chopping charge pump (C-CP) to mitigate 1/f noise in short-channel devices operating at a low supply voltage of 0.75 V. A charge-share cancellation technique is introduced to suppress ripple generated by residual charge from the previous reference period. The chopping modulation further reduces the charge pump’s white noise by filtering out high-order harmonics of folded noise, thereby significantly lowering in-band noise. In addition, a high-swing class-C/F2 voltage-controlled oscillator (VCO) is proposed to optimize out-of-band noise while maintaining low power consumption. Fabricated in 65-nm complementary metal oxide semiconductor (CMOS) with a core area of 0.64 mm2, the SS-CPLL achieves an in-band phase noise of −111.9 dBc/Hz at 1-kHz offset, an integrated jitter of 49.9 fs, and a figure-of-merit (FoM) of −257.1 dB at 9 GHz, while consuming 7.8 mW of power. The proposed SS-CPLL reduces in-band noise by approximately 15 dB compared with a conventional sub-sampling phase-locked loop (SSPLL), while maintaining a similar reference spur level of −58 dBc/Hz. This highlights the effectiveness of the C-CP and charge-share cancellation techniques.","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"60 4","pages":"1384-1396"},"PeriodicalIF":4.6000,"publicationDate":"2025-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A 9-GHz Low-In-Band Noise Sub-Sampling-Chopper PLL With Charge-Share Canceling Technique\",\"authors\":\"Xiangjian Kong;Kai Xu;Huanlin Xie;Mingchao Jian;Hao Lian;Robert Bogdan Staszewski;Chunbing Guo\",\"doi\":\"10.1109/JSSC.2025.3532504\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This article presents a low-jitter sub-sampling chopper phase-locked loop (SS-CPLL) that incorporates a novel chopping charge pump (C-CP) to mitigate 1/f noise in short-channel devices operating at a low supply voltage of 0.75 V. A charge-share cancellation technique is introduced to suppress ripple generated by residual charge from the previous reference period. The chopping modulation further reduces the charge pump’s white noise by filtering out high-order harmonics of folded noise, thereby significantly lowering in-band noise. In addition, a high-swing class-C/F2 voltage-controlled oscillator (VCO) is proposed to optimize out-of-band noise while maintaining low power consumption. Fabricated in 65-nm complementary metal oxide semiconductor (CMOS) with a core area of 0.64 mm2, the SS-CPLL achieves an in-band phase noise of −111.9 dBc/Hz at 1-kHz offset, an integrated jitter of 49.9 fs, and a figure-of-merit (FoM) of −257.1 dB at 9 GHz, while consuming 7.8 mW of power. The proposed SS-CPLL reduces in-band noise by approximately 15 dB compared with a conventional sub-sampling phase-locked loop (SSPLL), while maintaining a similar reference spur level of −58 dBc/Hz. This highlights the effectiveness of the C-CP and charge-share cancellation techniques.\",\"PeriodicalId\":13129,\"journal\":{\"name\":\"IEEE Journal of Solid-state Circuits\",\"volume\":\"60 4\",\"pages\":\"1384-1396\"},\"PeriodicalIF\":4.6000,\"publicationDate\":\"2025-03-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Journal of Solid-state Circuits\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10930756/\",\"RegionNum\":1,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Journal of Solid-state Circuits","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10930756/","RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
A 9-GHz Low-In-Band Noise Sub-Sampling-Chopper PLL With Charge-Share Canceling Technique
This article presents a low-jitter sub-sampling chopper phase-locked loop (SS-CPLL) that incorporates a novel chopping charge pump (C-CP) to mitigate 1/f noise in short-channel devices operating at a low supply voltage of 0.75 V. A charge-share cancellation technique is introduced to suppress ripple generated by residual charge from the previous reference period. The chopping modulation further reduces the charge pump’s white noise by filtering out high-order harmonics of folded noise, thereby significantly lowering in-band noise. In addition, a high-swing class-C/F2 voltage-controlled oscillator (VCO) is proposed to optimize out-of-band noise while maintaining low power consumption. Fabricated in 65-nm complementary metal oxide semiconductor (CMOS) with a core area of 0.64 mm2, the SS-CPLL achieves an in-band phase noise of −111.9 dBc/Hz at 1-kHz offset, an integrated jitter of 49.9 fs, and a figure-of-merit (FoM) of −257.1 dB at 9 GHz, while consuming 7.8 mW of power. The proposed SS-CPLL reduces in-band noise by approximately 15 dB compared with a conventional sub-sampling phase-locked loop (SSPLL), while maintaining a similar reference spur level of −58 dBc/Hz. This highlights the effectiveness of the C-CP and charge-share cancellation techniques.
期刊介绍:
The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.