铝微观结构对折射透镜光学性能影响的研究

IF 0.5 Q4 PHYSICS, CONDENSED MATTER

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-17 DOI:10.1134/S1027451024701830

A. S. Narikovich, I. I. Lyatun, I. B. Panormov, A. L. Astafiev, A. A. Barannikov, D. A. Zverev, A. A. Snigirev

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$Study of the Influence of Aluminum Microstructure on the Optical Properties of Refractive Lenses$

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Study of the Influence of Aluminum Microstructure on the Optical Properties of Refractive Lenses

This study analyzes the microstructure of X-ray refractive lenses made from high-purity aluminum, both on surface and bulk material properties. Optical microscopy was used to examine the detailed morphology of the lenses’ refractive surfaces. X-ray radiography demonstrated Bragg diffraction effects caused by the crystalline structure of aluminum grains, resulting in additional losses in the radiation intensity transmitted through the lenses.

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来源期刊

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques PHYSICS, CONDENSED MATTER-

CiteScore

0.90

自引率

25.00%

发文量

144

审稿时长

3-8 weeks

期刊介绍： Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.