氮化氧薄膜在生物医学中的应用

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
V. S. Filimonova, S. Y. Karelin, L. A. Krasnobaeva, S. V. Gusakova, E. V. Lisichko, N. N. Nikitenkov, V. S. Sypchenko
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引用次数: 0

摘要

用反应磁控溅射技术研究了用于生物医学支架的不锈钢表面的Ti-O-N涂层的结构、形貌和粗糙度。在衬底施加负偏压(-60 V)、衬底不施加偏压以及工作气体中氮氧比不同的情况下,分析沉积模式。所得涂层呈现锐钛矿结构。扫描电镜分析表明,当负偏压(-60 V)同时施加时,随着工作气体中氮浓度的增加,膜的晶粒尺寸减小。对献血者进行的体外研究,包括采血后通过1-2 mL/min的离心速率从红细胞中分离血浆,表明使用ti - o - n涂层底物(-60 V)可降低血小板水平并增加红细胞压积值。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

On the Application of Oxynitride Thin Films in Biomedicine

On the Application of Oxynitride Thin Films in Biomedicine

The structure, morphology, and roughness of Ti–O–N coatings applied to stainless steel surfaces using reactive magnetron sputtering are investigated for use as biomedical stents. The deposition modes are analyzed with a negative bias applied to the substrate (–60 V), with no bias applied to the substrate, and with varying nitrogen-to-oxygen ratios in the working gas. The resulting coatings exhibited an anatase structure. Analysis by scanning electron microscopy shows a decrease in the grain size of the films with an increase in nitrogen concentration in the working gas when a negative bias (–60 V) is simultaneously applied. In vitro studies conducted on blood donors, involving blood collection followed by plasma separation from erythrocytes through centrifugation at a rate of 1–2 mL/min, demonstrate that the use of Ti–O–N-coated substrates (–60 V) decrease platelet levels and increase hematocrit values.

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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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