基于硅折射透镜的 X 射线多透镜干涉仪，用于诊断辐射的相干特性

IF 0.5 Q4 PHYSICS, CONDENSED MATTER

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2025-03-17 DOI:10.1134/S1027451024701854

D. Zverev, M. Sorokovikov, V. Yunkin, S. Kuznetsov, A. Snigirev

{"title":"基于硅折射透镜的 X 射线多透镜干涉仪，用于诊断辐射的相干特性","authors":"D. Zverev, M. Sorokovikov, V. Yunkin, S. Kuznetsov, A. Snigirev","doi":"10.1134/S1027451024701854","DOIUrl":null,"url":null,"abstract":"<p>We are proposing an experimental demonstration of the change in the degree of coherence of X‑ray radiation scattered within a volume of high dispersion, weakly absorbing material—termed a decoherer. A multilens interferometer based on silicon planar compound refractive lenses is used as a diagnostic tool. The experiment was conducted at the ID13B beamline of the ESRF synchrotron radiation source (Grenoble, France) at an X-ray energy of 12.4 keV. The gradual increase in the thickness of the decoherer allowed for the observation of the degradation of the interference fringes formed by the interferometer.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 1 supplement","pages":"S45 - S50"},"PeriodicalIF":0.5000,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"X-ray Multilens Interferometer based on Silicon Refractive Lenses for Diagnostic of the Coherent Properties of Radiation\",\"authors\":\"D. Zverev, M. Sorokovikov, V. Yunkin, S. Kuznetsov, A. Snigirev\",\"doi\":\"10.1134/S1027451024701854\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>We are proposing an experimental demonstration of the change in the degree of coherence of X‑ray radiation scattered within a volume of high dispersion, weakly absorbing material—termed a decoherer. A multilens interferometer based on silicon planar compound refractive lenses is used as a diagnostic tool. The experiment was conducted at the ID13B beamline of the ESRF synchrotron radiation source (Grenoble, France) at an X-ray energy of 12.4 keV. The gradual increase in the thickness of the decoherer allowed for the observation of the degradation of the interference fringes formed by the interferometer.</p>\",\"PeriodicalId\":671,\"journal\":{\"name\":\"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques\",\"volume\":\"18 1 supplement\",\"pages\":\"S45 - S50\"},\"PeriodicalIF\":0.5000,\"publicationDate\":\"2025-03-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://link.springer.com/article/10.1134/S1027451024701854\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"PHYSICS, CONDENSED MATTER\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1134/S1027451024701854","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}

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本文章由计算机程序翻译，如有差异，请以英文原文为准。

$X-ray Multilens Interferometer based on Silicon Refractive Lenses for Diagnostic of the Coherent Properties of Radiation$

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X-ray Multilens Interferometer based on Silicon Refractive Lenses for Diagnostic of the Coherent Properties of Radiation

We are proposing an experimental demonstration of the change in the degree of coherence of X‑ray radiation scattered within a volume of high dispersion, weakly absorbing material—termed a decoherer. A multilens interferometer based on silicon planar compound refractive lenses is used as a diagnostic tool. The experiment was conducted at the ID13B beamline of the ESRF synchrotron radiation source (Grenoble, France) at an X-ray energy of 12.4 keV. The gradual increase in the thickness of the decoherer allowed for the observation of the degradation of the interference fringes formed by the interferometer.

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来源期刊

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques PHYSICS, CONDENSED MATTER-

CiteScore

0.90

自引率

25.00%

发文量

144

审稿时长

3-8 weeks

期刊介绍： Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.