关于导电织物随时间变化的机电响应的研究

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Amit Kumar Mandal, Dipayan Das, Maloy K. Singha
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A study on time-dependent electromechanical response of electroconductive textile

This study aimed to enhance the instantaneous electromechanical response of a carbon nanotube (CNT)-based electroconductive textile by postulating that the time-dependent electrical components, such as capacitors and inductors formed within the microstructure of such materials, are the primary contributors to their time-dependent resistances observed during mechanical straining. To investigate this, the characteristics and the configurations of these components in a circuit were estimated by employing curve fitting method on the basis of impedance and phase angle data across various frequencies and strain levels. Utilizing the predicted circuit model, the response of the measured resistance under different strain conditions was simulated using finite element method (FEM) under both alternating current (AC) and direct current (DC) supply. The findings indicated that the time-dependent electrical components did not exclusively account for the time-dependent response of the resistance measured during straining of the electroconductive textile. The high-frequency AC power supply also enhanced the instantaneous electromechanical response of the electroconductive textile.

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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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