掺镓CdO/p-Si异质结的合成及参数评价

IF 2.8 3区 物理与天体物理 Q2 PHYSICS, CONDENSED MATTER
Abdur Rouf, Md Saifur Rahman, M. Mojibur Rahman, M.S.I. Sarker, M.K.R. Khan
{"title":"掺镓CdO/p-Si异质结的合成及参数评价","authors":"Abdur Rouf,&nbsp;Md Saifur Rahman,&nbsp;M. Mojibur Rahman,&nbsp;M.S.I. Sarker,&nbsp;M.K.R. Khan","doi":"10.1016/j.physb.2025.417043","DOIUrl":null,"url":null,"abstract":"<div><div>In this work, Gallium (Ga) doped CdO:Ga/<em>p</em>-Si heterojunction thin films are fabricated by spray pyrolysis technique. Optical study of CdO and CdO:Ga films showed that the transparency ranges from 78 % to 73 % in the near infrared (NIR) region. Both the CdO and CdO:Ga films are direct band gap semiconductor and the band gap widens for different thickness of thin films. The photoluminescence (PL) study of CdO:Ga films grown on <em>p</em>-Si substrate showed two emission peaks for excitation wavelength 400 nm which are due to exciton emission and the band to band transition. The carrier concentrations for the CdO and CdO:Ga are found of the order of 10<sup>20</sup> cm<sup>−3</sup> are the indication of <em>n</em>-type semiconductors. The rectifying diode behavior of the CdO:Ga/p-Si heterojunctions is confirmed by the Current-Voltage (I-V) characteristics. The good diode characteristics are revealed through the ideality factor and the C–V response of the heterostructures.</div></div>","PeriodicalId":20116,"journal":{"name":"Physica B-condensed Matter","volume":"706 ","pages":"Article 417043"},"PeriodicalIF":2.8000,"publicationDate":"2025-02-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Synthesis of gallium (Ga) doped CdO/p-Si heterojunction and evaluation of junction parameters\",\"authors\":\"Abdur Rouf,&nbsp;Md Saifur Rahman,&nbsp;M. Mojibur Rahman,&nbsp;M.S.I. Sarker,&nbsp;M.K.R. Khan\",\"doi\":\"10.1016/j.physb.2025.417043\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>In this work, Gallium (Ga) doped CdO:Ga/<em>p</em>-Si heterojunction thin films are fabricated by spray pyrolysis technique. Optical study of CdO and CdO:Ga films showed that the transparency ranges from 78 % to 73 % in the near infrared (NIR) region. Both the CdO and CdO:Ga films are direct band gap semiconductor and the band gap widens for different thickness of thin films. The photoluminescence (PL) study of CdO:Ga films grown on <em>p</em>-Si substrate showed two emission peaks for excitation wavelength 400 nm which are due to exciton emission and the band to band transition. The carrier concentrations for the CdO and CdO:Ga are found of the order of 10<sup>20</sup> cm<sup>−3</sup> are the indication of <em>n</em>-type semiconductors. The rectifying diode behavior of the CdO:Ga/p-Si heterojunctions is confirmed by the Current-Voltage (I-V) characteristics. The good diode characteristics are revealed through the ideality factor and the C–V response of the heterostructures.</div></div>\",\"PeriodicalId\":20116,\"journal\":{\"name\":\"Physica B-condensed Matter\",\"volume\":\"706 \",\"pages\":\"Article 417043\"},\"PeriodicalIF\":2.8000,\"publicationDate\":\"2025-02-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Physica B-condensed Matter\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0921452625001607\",\"RegionNum\":3,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"PHYSICS, CONDENSED MATTER\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Physica B-condensed Matter","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0921452625001607","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0

摘要

本文采用喷雾热解技术制备了掺镓(Ga)的CdO:Ga/p-Si异质结薄膜。对CdO和CdO:Ga薄膜的光学研究表明,在近红外(NIR)区域,CdO和CdO:Ga薄膜的透明度在78% ~ 73%之间。CdO和CdO:Ga薄膜都是直接带隙半导体,薄膜厚度不同,带隙变宽。在p-Si衬底上生长的CdO:Ga薄膜的光致发光(PL)研究显示,在激发波长400 nm处有两个发射峰,这是由于激子发射和带间跃迁引起的。CdO和CdO:Ga的载流子浓度约为1020 cm−3,是n型半导体的表征。电流-电压(I-V)特性证实了CdO:Ga/p-Si异质结的整流二极管行为。通过理想因数和异质结构的C-V响应揭示了良好的二极管特性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Synthesis of gallium (Ga) doped CdO/p-Si heterojunction and evaluation of junction parameters
In this work, Gallium (Ga) doped CdO:Ga/p-Si heterojunction thin films are fabricated by spray pyrolysis technique. Optical study of CdO and CdO:Ga films showed that the transparency ranges from 78 % to 73 % in the near infrared (NIR) region. Both the CdO and CdO:Ga films are direct band gap semiconductor and the band gap widens for different thickness of thin films. The photoluminescence (PL) study of CdO:Ga films grown on p-Si substrate showed two emission peaks for excitation wavelength 400 nm which are due to exciton emission and the band to band transition. The carrier concentrations for the CdO and CdO:Ga are found of the order of 1020 cm−3 are the indication of n-type semiconductors. The rectifying diode behavior of the CdO:Ga/p-Si heterojunctions is confirmed by the Current-Voltage (I-V) characteristics. The good diode characteristics are revealed through the ideality factor and the C–V response of the heterostructures.
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来源期刊
Physica B-condensed Matter
Physica B-condensed Matter 物理-物理:凝聚态物理
CiteScore
4.90
自引率
7.10%
发文量
703
审稿时长
44 days
期刊介绍: Physica B: Condensed Matter comprises all condensed matter and material physics that involve theoretical, computational and experimental work. Papers should contain further developments and a proper discussion on the physics of experimental or theoretical results in one of the following areas: -Magnetism -Materials physics -Nanostructures and nanomaterials -Optics and optical materials -Quantum materials -Semiconductors -Strongly correlated systems -Superconductivity -Surfaces and interfaces
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