一种可编程高效电荷泵系统,用于提高电流驱动能力的嵌入式快闪存储器

IF 1.9 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Tao Xu, Yuqiao Xie, Guoji Qiu, Zhiyuan Hu, Zhengxuan Zhang, Dawei Bi
{"title":"一种可编程高效电荷泵系统,用于提高电流驱动能力的嵌入式快闪存储器","authors":"Tao Xu,&nbsp;Yuqiao Xie,&nbsp;Guoji Qiu,&nbsp;Zhiyuan Hu,&nbsp;Zhengxuan Zhang,&nbsp;Dawei Bi","doi":"10.1016/j.mejo.2025.106626","DOIUrl":null,"url":null,"abstract":"<div><div>Flash memory, a key element in embedded systems, necessitates high voltage for its operation, which is usually provided by charge pumps. This paper presents a programmable high efficiency charge pump system in 40 nm bulk CMOS technology powered from a 1.1 V supply. The proposed system integrates low-voltage MOS self-adaptive body-biased cross-coupled charge pumps and a high-voltage MOS self-adaptive body-biased cross-coupled charge pump with a doubler structure. The system adaptively activates the appropriate charge pump combination based on the current load, working in conjunction with a novel clock coupled voltage modulation circuit to achieve reduced power consumption and improved efficiency. The programmable high efficiency charge pump system can stabilize an output voltage of 6V at <span><math><mrow><mn>292</mn><mspace></mspace><mi>μ</mi><mi>A</mi></mrow></math></span> and 8V at <span><math><mrow><mn>235</mn><mspace></mspace><mi>μ</mi><mi>A</mi></mrow></math></span> under a 50 MHz clock. It achieves a peak efficiency of 64.04% at <span><math><mrow><mn>292</mn><mspace></mspace><mi>μ</mi><mi>A</mi></mrow></math></span> current load and occupies 0.145 mm<span><math><msup><mrow></mrow><mrow><mn>2</mn></mrow></msup></math></span> in area.</div></div>","PeriodicalId":49818,"journal":{"name":"Microelectronics Journal","volume":"159 ","pages":"Article 106626"},"PeriodicalIF":1.9000,"publicationDate":"2025-03-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A programmable high efficiency charge pump system for embedded flash memory with improved current driving capability\",\"authors\":\"Tao Xu,&nbsp;Yuqiao Xie,&nbsp;Guoji Qiu,&nbsp;Zhiyuan Hu,&nbsp;Zhengxuan Zhang,&nbsp;Dawei Bi\",\"doi\":\"10.1016/j.mejo.2025.106626\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Flash memory, a key element in embedded systems, necessitates high voltage for its operation, which is usually provided by charge pumps. This paper presents a programmable high efficiency charge pump system in 40 nm bulk CMOS technology powered from a 1.1 V supply. The proposed system integrates low-voltage MOS self-adaptive body-biased cross-coupled charge pumps and a high-voltage MOS self-adaptive body-biased cross-coupled charge pump with a doubler structure. The system adaptively activates the appropriate charge pump combination based on the current load, working in conjunction with a novel clock coupled voltage modulation circuit to achieve reduced power consumption and improved efficiency. The programmable high efficiency charge pump system can stabilize an output voltage of 6V at <span><math><mrow><mn>292</mn><mspace></mspace><mi>μ</mi><mi>A</mi></mrow></math></span> and 8V at <span><math><mrow><mn>235</mn><mspace></mspace><mi>μ</mi><mi>A</mi></mrow></math></span> under a 50 MHz clock. It achieves a peak efficiency of 64.04% at <span><math><mrow><mn>292</mn><mspace></mspace><mi>μ</mi><mi>A</mi></mrow></math></span> current load and occupies 0.145 mm<span><math><msup><mrow></mrow><mrow><mn>2</mn></mrow></msup></math></span> in area.</div></div>\",\"PeriodicalId\":49818,\"journal\":{\"name\":\"Microelectronics Journal\",\"volume\":\"159 \",\"pages\":\"Article 106626\"},\"PeriodicalIF\":1.9000,\"publicationDate\":\"2025-03-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microelectronics Journal\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S187923912500075X\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronics Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S187923912500075X","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

摘要

闪存是嵌入式系统的关键元件,其工作需要高电压,通常由电荷泵提供。本文提出了一种可编程的高效率电荷泵系统,该系统采用40nm块体CMOS技术,由1.1 V电源供电。该系统集成了低压MOS自适应体偏交叉耦合电荷泵和具有倍频结构的高压MOS自适应体偏交叉耦合电荷泵。该系统根据电流负载自适应激活适当的电荷泵组合,并与新颖的时钟耦合电压调制电路一起工作,以降低功耗并提高效率。在50mhz时钟下,可编程高效电荷泵系统在292μA和235μA时可稳定输出电压为6V和8V。在292μA电流负载下,效率达到64.04%,面积为0.145 mm2。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A programmable high efficiency charge pump system for embedded flash memory with improved current driving capability
Flash memory, a key element in embedded systems, necessitates high voltage for its operation, which is usually provided by charge pumps. This paper presents a programmable high efficiency charge pump system in 40 nm bulk CMOS technology powered from a 1.1 V supply. The proposed system integrates low-voltage MOS self-adaptive body-biased cross-coupled charge pumps and a high-voltage MOS self-adaptive body-biased cross-coupled charge pump with a doubler structure. The system adaptively activates the appropriate charge pump combination based on the current load, working in conjunction with a novel clock coupled voltage modulation circuit to achieve reduced power consumption and improved efficiency. The programmable high efficiency charge pump system can stabilize an output voltage of 6V at 292μA and 8V at 235μA under a 50 MHz clock. It achieves a peak efficiency of 64.04% at 292μA current load and occupies 0.145 mm2 in area.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
Microelectronics Journal
Microelectronics Journal 工程技术-工程:电子与电气
CiteScore
4.00
自引率
27.30%
发文量
222
审稿时长
43 days
期刊介绍: Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems. The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc. Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信