用ag修饰的多孔硅制备金属-半导体-金属和异质结近红外探测器及其性能的比较

IF 2.7 Q2 PHYSICS, CONDENSED MATTER
Sayran A. Abdulgafar , Mohammed A. Ibrahem , Lary H. Slewa
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引用次数: 0

摘要

由于先进的近红外(NIR)光电探测器在成像、通信和环境监测方面的应用,对它们的需求激增。本研究研究了用银纳米粒子(AgNPs)修饰的多孔硅(PSi)基近红外光电探测器的光电性能,这些探测器具有两种结构:金属-半导体-金属(MSM) (Au/AgNPs-PSi/Au)和异质结(Au/AgNPs-PSi/Si/Al)。通过在黑暗和照明条件下(850 nm, 20 W/cm2)的电流-电压特性来评估器件性能。在5 V时,异质结探测器的灵敏度为20.6 × 102%,响应率为1.8 mA/W,优于MSM器件(3.15 × 102%, 1.48 mA/W)。这种增强归功于结处的内置电场,它促进了有效的载流子分离,以及优化的AgNP-PSi形态,增强了光吸收。此外,异质结器件表现出更快的上升和下降时间,表明载流子输运动力学得到改善。本研究为使用改进PSi的高性能近红外光电探测器的设计提供了见解,并强调了异质结结构在改进光电探测方面的潜力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Comparative fabrication and performance of metal-semiconductor-metal and heterojunction near-infrared photodetectors using Ag-modified porous silicon
The demand for advanced near-infrared (NIR) photodetectors has surged due to their applications in imaging, communications, and environmental monitoring. This study examines the photoelectric properties of porous silicon (PSi)-based NIR photodetectors modified with silver nanoparticles (AgNPs) in two configurations: metal-semiconductor-metal (MSM) (Au/AgNPs-PSi/Au) and heterojunction (Au/AgNPs-PSi/Si/Al). Device performance was evaluated via current-voltage characteristics under dark and illuminated conditions (850 nm, 20 W/cm2). At 5 V, the heterojunction detector achieved a sensitivity of 20.6 × 102 % and a responsivity of 1.8 mA/W, outperforming the MSM device (3.15 × 102 %, 1.48 mA/W). This enhancement is attributed to the built-in electric field at the junction, which promotes efficient carrier separation, and the optimized AgNP–PSi morphology that enhances light absorption. Additionally, the heterojunction device demonstrated faster rise and fall times, indicating improved carrier transport dynamics. This study provides insight into the design of high-performance NIR photodetectors using modified PSi and highlights the potential of heterojunction configurations for improved photodetection.
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CiteScore
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