基于相移Lissajous轨迹优化的MEMS扫描镜投影显示增强方法

IF 4.9 3区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Shaotang Wei , Jinwu Song , Junya Wang , Zheng You
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引用次数: 0

摘要

双轴谐振MEMS扫描镜具有高工作频率和宽扫描角度的特点,在先进的投影显示系统中具有巨大的潜力。然而,传统的固定参数Lissajous扫描往往存在像素覆盖不均匀和分辨率不一致的问题。本文提出了一种新的基于相移的Lissajous轨迹优化方法,该方法在每帧扫描中动态调整初始相位。该方法显著提高了弹道覆盖均匀性,减轻了像素缺陷和屏蔽门效应等像素化伪影。理论分析和数值模拟验证了相移策略与传统的固定参数扫描相比可以提高空间覆盖范围。此外,实验结果证实了该方法在提供高质量投影显示方面的有效性,即使在低帧速率下也是如此。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Enhancing MEMS scanning mirror projection displays through phase-shifted Lissajous trajectory optimization
Biaxial resonant MEMS scanning mirrors, characterized by high operational frequencies and wide scanning angles, hold significant potential for advanced projection display systems. Nevertheless, conventional Lissajous scanning with fixed parameters often suffers from non-uniform pixel coverage and resolution inconsistencies. This study presents a novel phase-shift-based Lissajous trajectory optimization method, wherein the initial phase is dynamically adjusted for each scanning frame. The proposed approach markedly improves trajectory coverage uniformity and mitigates pixelation artifacts, including pixel defects and the screen-door effect. Theoretical analysis and numerical simulations validate the enhanced spatial coverage achieved by the phase-shifting strategy compared to traditional fixed-parameter scanning. Furthermore, experimental results substantiate the method’s efficacy in delivering high- quality projection displays, even at low frame rates.
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来源期刊
Sensors and Actuators A-physical
Sensors and Actuators A-physical 工程技术-工程:电子与电气
CiteScore
8.10
自引率
6.50%
发文量
630
审稿时长
49 days
期刊介绍: Sensors and Actuators A: Physical brings together multidisciplinary interests in one journal entirely devoted to disseminating information on all aspects of research and development of solid-state devices for transducing physical signals. Sensors and Actuators A: Physical regularly publishes original papers, letters to the Editors and from time to time invited review articles within the following device areas: • Fundamentals and Physics, such as: classification of effects, physical effects, measurement theory, modelling of sensors, measurement standards, measurement errors, units and constants, time and frequency measurement. Modeling papers should bring new modeling techniques to the field and be supported by experimental results. • Materials and their Processing, such as: piezoelectric materials, polymers, metal oxides, III-V and II-VI semiconductors, thick and thin films, optical glass fibres, amorphous, polycrystalline and monocrystalline silicon. • Optoelectronic sensors, such as: photovoltaic diodes, photoconductors, photodiodes, phototransistors, positron-sensitive photodetectors, optoisolators, photodiode arrays, charge-coupled devices, light-emitting diodes, injection lasers and liquid-crystal displays. • Mechanical sensors, such as: metallic, thin-film and semiconductor strain gauges, diffused silicon pressure sensors, silicon accelerometers, solid-state displacement transducers, piezo junction devices, piezoelectric field-effect transducers (PiFETs), tunnel-diode strain sensors, surface acoustic wave devices, silicon micromechanical switches, solid-state flow meters and electronic flow controllers. Etc...
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