铜铁氧体掺杂锆陶瓷的相变、形貌及屏蔽检测

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
Fawzy H. Sallam, Aljawhara H. Almuqrin, Ahmed Abdelaziz, Mohamed I. Elkhatib, M. I. Sayyed, K. A. Mahmoud
{"title":"铜铁氧体掺杂锆陶瓷的相变、形貌及屏蔽检测","authors":"Fawzy H. Sallam,&nbsp;Aljawhara H. Almuqrin,&nbsp;Ahmed Abdelaziz,&nbsp;Mohamed I. Elkhatib,&nbsp;M. I. Sayyed,&nbsp;K. A. Mahmoud","doi":"10.1007/s10854-025-14413-x","DOIUrl":null,"url":null,"abstract":"<div><p>Zirconium-doped copper ferrite nanoparticles were synthesized by a wet chemical synthesis process with the composition CuFe<sub>2-x</sub>Zr<sub>x</sub>O<sub>4</sub> where x = 0.00, 0.015, 0.03, and 0.05 wt. %. The microstructure and phases presented in the nanopowder were investigated by x-ray diffraction analysis, in which a single tetragonal spinel phase was revealed for samples without Zr content. In contrast, dual tetragonal phases were revealed at different Zr concentrations. Also, the powder’s particle size was calculated at 5, 6, and 9.2 nm at X = 0.00, 0.03, and 0.05 wt. % using X-ray patterns and Williamson-Hall size analysis. The prepared samples were calcinated above 800 °C to obtain ceramic samples. Ferrite ceramic’s surface morphology was inspected using a scanning electron microscope; elemental mapping was performed using energy-dispersive X-ray microanalysis. Additionally, the prepared ceramic samples’ γ-ray shielding ability was examined via Monte Carlo simulation over the 0.0332–2.506 MeV energy range. Cu and Fe’s partial substitution by Zr ions decreased the prepared zirconium-doped copper ferrite ceramic samples’ linear attenuation coefficient by 15.37%, 18.46%, and 18.63% at 0.059 MeV, 0.662 MeV, and 2.506 MeV, respectively, and the radiation protection efficiency from 44.89% to 38.48%, when the Zr concentration raised throughout 0–4.3 wt. %.</p></div>","PeriodicalId":646,"journal":{"name":"Journal of Materials Science: Materials in Electronics","volume":"36 7","pages":""},"PeriodicalIF":2.8000,"publicationDate":"2025-03-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Phase transition, morphology and shielding inspection of copper ferrite doped zirconium ceramics\",\"authors\":\"Fawzy H. Sallam,&nbsp;Aljawhara H. Almuqrin,&nbsp;Ahmed Abdelaziz,&nbsp;Mohamed I. Elkhatib,&nbsp;M. I. Sayyed,&nbsp;K. A. Mahmoud\",\"doi\":\"10.1007/s10854-025-14413-x\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>Zirconium-doped copper ferrite nanoparticles were synthesized by a wet chemical synthesis process with the composition CuFe<sub>2-x</sub>Zr<sub>x</sub>O<sub>4</sub> where x = 0.00, 0.015, 0.03, and 0.05 wt. %. The microstructure and phases presented in the nanopowder were investigated by x-ray diffraction analysis, in which a single tetragonal spinel phase was revealed for samples without Zr content. In contrast, dual tetragonal phases were revealed at different Zr concentrations. Also, the powder’s particle size was calculated at 5, 6, and 9.2 nm at X = 0.00, 0.03, and 0.05 wt. % using X-ray patterns and Williamson-Hall size analysis. The prepared samples were calcinated above 800 °C to obtain ceramic samples. Ferrite ceramic’s surface morphology was inspected using a scanning electron microscope; elemental mapping was performed using energy-dispersive X-ray microanalysis. Additionally, the prepared ceramic samples’ γ-ray shielding ability was examined via Monte Carlo simulation over the 0.0332–2.506 MeV energy range. Cu and Fe’s partial substitution by Zr ions decreased the prepared zirconium-doped copper ferrite ceramic samples’ linear attenuation coefficient by 15.37%, 18.46%, and 18.63% at 0.059 MeV, 0.662 MeV, and 2.506 MeV, respectively, and the radiation protection efficiency from 44.89% to 38.48%, when the Zr concentration raised throughout 0–4.3 wt. %.</p></div>\",\"PeriodicalId\":646,\"journal\":{\"name\":\"Journal of Materials Science: Materials in Electronics\",\"volume\":\"36 7\",\"pages\":\"\"},\"PeriodicalIF\":2.8000,\"publicationDate\":\"2025-03-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Materials Science: Materials in Electronics\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://link.springer.com/article/10.1007/s10854-025-14413-x\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Materials Science: Materials in Electronics","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s10854-025-14413-x","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

摘要

采用湿法化学合成方法合成了掺杂锆的铁酸铜纳米颗粒,其组成为CuFe2-xZrxO4,其中x = 0.00, 0.015, 0.03和0.05 wt. %。x射线衍射分析表明,在不含Zr的情况下,纳米粉末的微观结构和物相呈现出单一的四方尖晶石相。相反,在不同的Zr浓度下,出现了双四方相。此外,在X = 0.00, 0.03和0.05 wt. %时,使用X射线图和Williamson-Hall粒度分析计算了粉末在5,6和9.2 nm处的粒度。将制备好的样品在800℃以上煅烧得到陶瓷样品。用扫描电镜观察铁氧体陶瓷的表面形貌;使用能量色散x射线微量分析进行元素映射。此外,在0.0332 ~ 2.506 MeV能量范围内,通过蒙特卡罗模拟测试了制备的陶瓷样品的γ射线屏蔽能力。在0.059 MeV、0.662 MeV和2.506 MeV时,Cu和Fe被Zr离子部分取代,制备的锆掺杂铁氧体铜陶瓷样品的线性衰减系数分别降低了15.37%、18.46%和18.63%,当Zr浓度升高0-4.3 wt. %时,辐射防护效率从44.89%提高到38.48%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Phase transition, morphology and shielding inspection of copper ferrite doped zirconium ceramics

Phase transition, morphology and shielding inspection of copper ferrite doped zirconium ceramics

Zirconium-doped copper ferrite nanoparticles were synthesized by a wet chemical synthesis process with the composition CuFe2-xZrxO4 where x = 0.00, 0.015, 0.03, and 0.05 wt. %. The microstructure and phases presented in the nanopowder were investigated by x-ray diffraction analysis, in which a single tetragonal spinel phase was revealed for samples without Zr content. In contrast, dual tetragonal phases were revealed at different Zr concentrations. Also, the powder’s particle size was calculated at 5, 6, and 9.2 nm at X = 0.00, 0.03, and 0.05 wt. % using X-ray patterns and Williamson-Hall size analysis. The prepared samples were calcinated above 800 °C to obtain ceramic samples. Ferrite ceramic’s surface morphology was inspected using a scanning electron microscope; elemental mapping was performed using energy-dispersive X-ray microanalysis. Additionally, the prepared ceramic samples’ γ-ray shielding ability was examined via Monte Carlo simulation over the 0.0332–2.506 MeV energy range. Cu and Fe’s partial substitution by Zr ions decreased the prepared zirconium-doped copper ferrite ceramic samples’ linear attenuation coefficient by 15.37%, 18.46%, and 18.63% at 0.059 MeV, 0.662 MeV, and 2.506 MeV, respectively, and the radiation protection efficiency from 44.89% to 38.48%, when the Zr concentration raised throughout 0–4.3 wt. %.

求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信