I. I. Lyatun, P. N. Medvedskaya, A. S. Korotkov, S. A. Shevyrtalov, S. S. Lyatun, A. A. Snigirev
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High-Resolution X-Ray Micro-Optics: Technologies and Materials
The prospects for using high-resolution X-ray microlenses for coherent visualization tasks are discussed. Modern technologies and methods of microprocessing for the manufacture of 2D microlenses are considered using laser systems, ion-beam lithography, and additive technologies as an example. The efficiency of various materials for X-ray micro-optics applications is evaluated, and the time spent on manufacturing 100 nm resolution micro objectives using ion-beam lithography systems is optimized.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.