N. I. Nepsha, N. Yu. Sdobnyakov, V. M. Samsonov, I. V. Talyzin, A. Yu. Kolosov, D. V. Zhigunov, K. G. Savina, A. A. Romanov
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引用次数: 0
摘要
采用比较原子模拟的方法研究了二元Pt-Pd纳米合金和三元Pt-Pd - Ni纳米合金的偏析和热诱导结构转变(熔化/结晶),其中Ni (20% at %)作为掺杂成分。采用分子动力学和蒙特卡罗方法相结合的方法进行原子模拟。此外,还使用了自主开发的两个计算机程序LAMMPS和Metropolis,以及嵌入式原子方法对应的两种不同的势参数化,以及替代力场紧密结合势进行了模拟。在2500和5000个原子组成的二元和三元纳米粒子中均观察到钯的表面偏析。最明显的是,掺杂影响了结构偏析,诱导了由几个fcc颗粒组成的纳米晶体向具有近似五边形对称的纳米团簇的转变。研究表明,尺寸效应对熔化结晶滞后参数的影响比对结构偏析模式参数的影响更为显著,结构偏析模式是指纳米颗粒在不同晶体结构和组分偏析相对应的区域内的划分。
Atomistic Simulation of Segregation in Ternary Pt–Pd–Ni Nanoalloy
The results of comparative atomistic simulation are presented for segregation and thermally induced structural transformations (melting/crystallization) in binary Pt–Pd nanoalloys and ternary Pt–Pd–Ni nanoparticles, where Ni (20 at %) acted as a doping component. Atomistic simulation was carried out using an integrated approach combining molecular dynamics and Monte Carlo methods. In addition, two independently developed computer programs, LAMMPS and Metropolis, two different parameterizations of potentials corresponding to the embedded atom method, as well as an alternative force field, the tight-binding potential, were used for the simulation. Surface segregation of Pd was observed in both binary and ternary nanoparticles consisting of 2500 and 5000 atoms. Most noticeably, doping affected structural segregation, inducing a transition from a nanocrystal consisting of several fcc grains to a nanocluster with approximately pentagonal symmetry. It has been established that the size effect is more noticeable for parameters of the melting–crystallization hysteresis than for the structural segregation patterns, that is, the division of a nanoparticle into areas corresponding to different crystal structures and the segregation of components.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.