自成型氮化硅纳米掩膜及其应用

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
V. K. Smirnov, D. S. Kibalov, P. A. Lepshin, I. V. Zhuravlev, G. F. Smirnova
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引用次数: 0

摘要

氮离子斜束溅射过程中,在单晶或非晶硅表面产生自形成的波序结构。波序结构是一种固体纳米掩膜,一种致密的氮化硅纳米条纹阵列,周期在30 - 90nm之间。考虑了离子轰击区在硅表面形成尖锐的几何边界所引起的纳米掩膜空间相干性。基于纳米掩膜和蚀刻工艺(湿法和干法),形成了各种纳米结构,用于不同的高技术。太阳能电池、纳米线网格偏振器和用于表面增强拉曼光谱的纳米结构硅衬底的原型已经创建。本文介绍了在纳米结构硅衬底上溶菌酶蛋白结晶初始阶段的研究结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Self-Forming Silicon Nitride Nanomask and Its Applications

Self-Forming Silicon Nitride Nanomask and Its Applications

A self-forming wave-ordered structure arises on the surface of single-crystal or amorphous silicon during its sputtering with an inclined beam of nitrogen ions. The wave-ordered structure is a solid nanomask, a dense array of silicon nitride nanostripes with a period in the range of 30–90 nm. The induced spatial coherence of the nanomask due to the formation of sharp geometric boundaries on silicon surface in the areas of ion bombardment is considered. Based on the nanomask and etching processes (wet and dry), various nanostructures are formed, which are used in different high technologies. Prototypes of solar cells, nanowire grid polarizers, and nanostructured silicon substrates for surface-enhanced Raman spectroscopy have been created. The results of a study of the initial stages of lysozyme protein crystallization on nanostructured silicon substrates are presented.

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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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