两个反射实验案例的gd参考层法

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
E. S. Nikova, Yu. A. Salamatov, E. A. Kravtsov
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引用次数: 0

摘要

本文提出了一种利用钆参考层测定中子反射振幅的模量和相位的方法,这种方法可以将必要的实验次数从3次减少到2次。结果表明,仅根据两次反射实验的结果就可以重建反射幅值。然而,当进行两个实验时,计算反射振幅是复杂的,因为会有两个解而不是一个。因此,有必要对得到的结果进行评估,因为其中一个解将没有物理意义。结果是根据样品的先验信息或借助相互作用势的额外建模来评估的。详细介绍了该方法的原理,并对Al2O3//Ti薄膜的模型数值计算进行了验证。给出了试样Al2O3//Nb和Si//Cr/Fe/Cr的实验结果。对处理三次和处理二次实验所得的反射率模量和相位进行了比较。研究发现,在统计数据较差的情况下,进行两次实验是可取的,因为在这种情况下,解决方案包含较少的数学处理伪影。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Gd–Reference–Layer Method for the Case of Two Reflectometry Experiments

Gd–Reference–Layer Method for the Case of Two Reflectometry Experiments

The article presents an approach to determining the modulus and phase of neutron reflection amplitude using a gadolinium reference layer, which allows reducing the number of necessary experiments from three to two. It is shown that it is possible to reconstruct the reflection amplitude based on the results of only two reflectometric experiments. However, when conducting two experiments, calculating the reflection amplitude is complicated by the fact that there will be two solutions instead of one. Therefore, it is necessary to evaluate the obtained results, since one of these solutions will have no physical meaning. The results are evaluated based on a priori information about the sample or with the help of additional modeling of the interaction potential. The theory of the proposed approach is described in detail, and it is tested on model numerical calculations for the Al2O3//Ti film. Experimental results for the test samples Al2O3//Nb and Si//Cr/Fe/Cr are presented. A comparison of the moduli and phases of the reflectivity obtained by processing three and two experiments is carried out. It was found that under conditions of poor statistics, conducting two experiments is preferable, since the solution, in this case, contains fewer artifacts of mathematical processing.

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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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