利用电化学芯片设计可控气氛下薄片全固态电池的透射电镜实验

IF 2.2 3区 工程技术 Q1 MICROSCOPY
Paul Naillou , Adrien Boulineau , Sami Oukassi , Philippe Azaïs
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引用次数: 0

摘要

虽然透射电子显微镜(TEM)领域的原位技术为各种物理现象提供了越来越有用和准确的数据,但全固态锂离子电池(ASSLIB)界面上发生的电化学反应仍然不完全清楚。界面的高分辨率和时间分辨率透射电镜观察是电池研究的顶峰,但目前最有前途的固体电解质材料在标准表征协议(如环境空气敏感性)方面表现出很大的不便。虽然有几个小组已经开发出了原位透射电镜研究锂离子电池的方法,主要是通过薄片制备,但似乎很少有人将样品保持在受控气氛中。然而,这可以作为在转移和获取过程中保持材料完整性的关键标准。在这项工作中,我们描述了我们通过一种新技术在薄层全固态锂离子电池上进行操作透射电镜表征的尝试,该技术涉及使用特定的可控气氛样品容器和包括电子透明窗口在内的电化学芯片。讨论了该方法的研究成果、面临的挑战和发展前景。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Designing TEM experiments with thin lamella all-solid-state cells in controlled atmosphere using electrochemical chips
While in situ techniques in transmission electron microscopy (TEM) field provide increasingly more useful and accurate data on various physical phenomena, electrochemical reactions occurring on interfaces in all-solid-state lithium-ion batteries (ASSLIB) still remain incompletely understood. High resolution and time-resolved TEM observations of interfaces stand as the pinnacle of battery research, but current most promising solid electrolyte materials exhibit major inconveniences for standard characterization protocols such as ambient air sensitivity. While several groups have developed methods to study lithium-ion cells in in situ TEM, mostly through thin lamella preparation, few seemed to have kept the sample in controlled atmosphere. Yet, this can stand as a critical criterion for maintaining material integrity during transfer and acquisition. In this work, we describe our attempt to lead operando-TEM characterization on a thin lamella all-solid-state lithium-ion cell by a new technique involving the use of a specific controlled-atmosphere sample holder and electrochemical chips including electron-transparent windows. Achievements, challenges and prospects of this method are discussed here.
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来源期刊
Micron
Micron 工程技术-显微镜技术
CiteScore
4.30
自引率
4.20%
发文量
100
审稿时长
31 days
期刊介绍: Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.
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