利用调幅交流电抛光一步制得锋利的铂/铱尖端

IF 3.6 2区物理与天体物理 Q2 PHYSICS, APPLIED

Applied Physics Letters Pub Date : 2025-02-26 DOI:10.1063/5.0251481

Yuto Nishiwaki, Toru Utsunomiya, Shu Kurokawa, Takashi Ichii

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引用次数: 0

摘要

采用调幅交流电抛光法制备了扫描探针显微用铂/铱（Pt/Ir）合金针尖。在CaCl2/H2O/丙酮溶液中，施加频率（f0）为900 Hz≤f0≤1500 Hz的正弦电压，用调制频率（fs）为fs=0.1f0的正弦波调幅，可重复性地获得曲率半径小于100 nm的干净尖端。用能量色散x射线分析仪和原子探针断层扫描电镜分析表明，在尖端表面暴露出均匀的Pt/Ir合金，表面干净，没有O和Cl污染。利用该尖端进行扫描隧道显微镜（STM）成像表明，它比传统的切割尖端更适合于粗糙表面的研究，并适用于原子分辨率成像。此外，我们将制作的尖端应用于液体中的qPlus原子力显微镜（AFM）分析，结果表明它在水平和垂直方向上都具有原子分辨率。因此，可以得出结论，调幅交流刻蚀方法可重复性地提供具有原子分辨率和大面积分析能力的STM/AFM尖端，而无需复杂的刻蚀设置。

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One-step fabrication of sharp platinum/iridium tips via amplitude-modulated alternating-current electropolishing

The platinum/iridium (Pt/Ir) alloy tip for scanning probe microscopy was fabricated by amplitude-modulated alternating-current electropolishing. The clean tips with a radius of curvature less than 100 nm were reproducibly obtained by applying the sinusoidal voltage in the frequency (f0) of 900 Hz≤f0≤1500 Hz with amplitude modulation by the sinusoidal wave in the modulation frequency (fs) of fs=0.1f0 in CaCl2/H2O/acetone solution. The analyses by scanning electron microscopy with an energy-dispersive x-ray analyzer and atom probe tomography showed that a uniform Pt/Ir alloy was exposed on the tip surface as a clean surface without O or Cl contamination. The scanning tunneling microscopy (STM) imaging using the fabricated tip showed that it is more suitable for investigating rough surfaces than conventional as-cut tips and applicable for atomic-resolution imaging. Furthermore, we applied the fabricated tip to qPlus atomic force microscopy (AFM) analysis in liquid and showed that it has atomic resolution in both the horizontal and vertical directions. Therefore, it is concluded that the amplitude-modulated AC etching method reproducibly provides sharp STM/AFM tips capable of both atomic resolution and large-area analyses without complex etching setups.

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来源期刊

Applied Physics Letters 物理-物理：应用

CiteScore

6.40

自引率

10.00%

发文量

1821

审稿时长

1.6 months

期刊介绍： Applied Physics Letters (APL) features concise, up-to-date reports on significant new findings in applied physics. Emphasizing rapid dissemination of key data and new physical insights, APL offers prompt publication of new experimental and theoretical papers reporting applications of physics phenomena to all branches of science, engineering, and modern technology. In addition to regular articles, the journal also publishes invited Fast Track, Perspectives, and in-depth Editorials which report on cutting-edge areas in applied physics. APL Perspectives are forward-looking invited letters which highlight recent developments or discoveries. Emphasis is placed on very recent developments, potentially disruptive technologies, open questions and possible solutions. They also include a mini-roadmap detailing where the community should direct efforts in order for the phenomena to be viable for application and the challenges associated with meeting that performance threshold. Perspectives are characterized by personal viewpoints and opinions of recognized experts in the field. Fast Track articles are invited original research articles that report results that are particularly novel and important or provide a significant advancement in an emerging field. Because of the urgency and scientific importance of the work, the peer review process is accelerated. If, during the review process, it becomes apparent that the paper does not meet the Fast Track criterion, it is returned to a normal track.