{"title":"基于互贴器的 2.5-D 集成电路中的电气和热特性优化","authors":"Changle Zhi;Gang Dong;Deguang Yang;Daihang Liu;Yinghao Feng;Yang Wang;Zhangming Zhu","doi":"10.1109/TVLSI.2024.3478846","DOIUrl":null,"url":null,"abstract":"In this work, a comprehensive analysis and optimization method of electrical and thermal characteristics in 2.5-D integrated circuits (ICs) is performed, including rapid heat distribution modeling, integrated voltage regulator (IVR) chip modeling, and power delivery network (PDN) modeling. Based on the proposed method, chiplet placement, decoupling placement, and IVR parameter settings that compromise the total PDN impedance, IVR impedance, and thermal distribution characteristics can be obtained. First, a rapid thermal analysis method for multiple heat sources is proposed by integrating the equivalent thermal resistance method and commercial tools. The thermal method significantly improves the computational efficiency and reduces the memory usage. Then, we analyze the electrical characteristics of a typical low dropout (LDO) and model the complete 2.5-D PDN, including interposers, chiplets, IVRs, through-silicon vias (TSVs), bumps, decoupling capacitors, and other components. The electrical and thermal problems in the 2.5-D system are formulated and a Metropolis rule-based algorithm is used to derive optimal solutions. Finally, the optimal placement schemes and parameter settings are iterated under different constraints. This method allows for the adjustment of target impedance, noise current, thermal limit, and other constraints based on varying practical situations. In the time-domain analysis, it can be found that the capacitance value is reduced while maintaining the power supply performance. With high accuracy in thermal and electrical modeling, this work provides an in-depth reference for the co-design of chiplet-based 2.5-D ICs.","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":"33 3","pages":"627-637"},"PeriodicalIF":2.8000,"publicationDate":"2024-10-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Electrical and Thermal Characteristics Optimization in Interposer-Based 2.5-D Integrated Circuits\",\"authors\":\"Changle Zhi;Gang Dong;Deguang Yang;Daihang Liu;Yinghao Feng;Yang Wang;Zhangming Zhu\",\"doi\":\"10.1109/TVLSI.2024.3478846\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work, a comprehensive analysis and optimization method of electrical and thermal characteristics in 2.5-D integrated circuits (ICs) is performed, including rapid heat distribution modeling, integrated voltage regulator (IVR) chip modeling, and power delivery network (PDN) modeling. Based on the proposed method, chiplet placement, decoupling placement, and IVR parameter settings that compromise the total PDN impedance, IVR impedance, and thermal distribution characteristics can be obtained. First, a rapid thermal analysis method for multiple heat sources is proposed by integrating the equivalent thermal resistance method and commercial tools. The thermal method significantly improves the computational efficiency and reduces the memory usage. Then, we analyze the electrical characteristics of a typical low dropout (LDO) and model the complete 2.5-D PDN, including interposers, chiplets, IVRs, through-silicon vias (TSVs), bumps, decoupling capacitors, and other components. The electrical and thermal problems in the 2.5-D system are formulated and a Metropolis rule-based algorithm is used to derive optimal solutions. Finally, the optimal placement schemes and parameter settings are iterated under different constraints. This method allows for the adjustment of target impedance, noise current, thermal limit, and other constraints based on varying practical situations. In the time-domain analysis, it can be found that the capacitance value is reduced while maintaining the power supply performance. With high accuracy in thermal and electrical modeling, this work provides an in-depth reference for the co-design of chiplet-based 2.5-D ICs.\",\"PeriodicalId\":13425,\"journal\":{\"name\":\"IEEE Transactions on Very Large Scale Integration (VLSI) Systems\",\"volume\":\"33 3\",\"pages\":\"627-637\"},\"PeriodicalIF\":2.8000,\"publicationDate\":\"2024-10-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Very Large Scale Integration (VLSI) Systems\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10735253/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10735253/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
Electrical and Thermal Characteristics Optimization in Interposer-Based 2.5-D Integrated Circuits
In this work, a comprehensive analysis and optimization method of electrical and thermal characteristics in 2.5-D integrated circuits (ICs) is performed, including rapid heat distribution modeling, integrated voltage regulator (IVR) chip modeling, and power delivery network (PDN) modeling. Based on the proposed method, chiplet placement, decoupling placement, and IVR parameter settings that compromise the total PDN impedance, IVR impedance, and thermal distribution characteristics can be obtained. First, a rapid thermal analysis method for multiple heat sources is proposed by integrating the equivalent thermal resistance method and commercial tools. The thermal method significantly improves the computational efficiency and reduces the memory usage. Then, we analyze the electrical characteristics of a typical low dropout (LDO) and model the complete 2.5-D PDN, including interposers, chiplets, IVRs, through-silicon vias (TSVs), bumps, decoupling capacitors, and other components. The electrical and thermal problems in the 2.5-D system are formulated and a Metropolis rule-based algorithm is used to derive optimal solutions. Finally, the optimal placement schemes and parameter settings are iterated under different constraints. This method allows for the adjustment of target impedance, noise current, thermal limit, and other constraints based on varying practical situations. In the time-domain analysis, it can be found that the capacitance value is reduced while maintaining the power supply performance. With high accuracy in thermal and electrical modeling, this work provides an in-depth reference for the co-design of chiplet-based 2.5-D ICs.
期刊介绍:
The IEEE Transactions on VLSI Systems is published as a monthly journal under the co-sponsorship of the IEEE Circuits and Systems Society, the IEEE Computer Society, and the IEEE Solid-State Circuits Society.
Design and realization of microelectronic systems using VLSI/ULSI technologies require close collaboration among scientists and engineers in the fields of systems architecture, logic and circuit design, chips and wafer fabrication, packaging, testing and systems applications. Generation of specifications, design and verification must be performed at all abstraction levels, including the system, register-transfer, logic, circuit, transistor and process levels.
To address this critical area through a common forum, the IEEE Transactions on VLSI Systems have been founded. The editorial board, consisting of international experts, invites original papers which emphasize and merit the novel systems integration aspects of microelectronic systems including interactions among systems design and partitioning, logic and memory design, digital and analog circuit design, layout synthesis, CAD tools, chips and wafer fabrication, testing and packaging, and systems level qualification. Thus, the coverage of these Transactions will focus on VLSI/ULSI microelectronic systems integration.