在连续光束透射电子显微镜中观察驻波

IF 6.7 1区 物理与天体物理 Q1 MATERIALS SCIENCE, MULTIDISCIPLINARY
Jonathan T. Weber, Niklas Müller, Alexander Schröder and Sascha Schäfer*, 
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引用次数: 0

摘要

纯差检测的受限光场相位分辨成像技术是纳米光学和光子学计量学的基础,但其在电子显微镜中的应用目前还很有限。在这里,我们报告了在连续光束透射电子显微镜中,用飞秒光脉冲照射波导结构的光学模式映射。多光子光电发射产生的残余电荷模式,我们用洛伦兹显微镜成像。所产生的图像对比度与驻波的强度分布有关,并在分析模型中进行定量描述。该方法的鲁棒性在更宽的参数范围和更复杂的样品几何形状(包括微观和纳米结构)中得到了展示。我们进一步讨论了光干涉充电技术在原位激发电子显微镜中的应用,为传播光场相位分辨成像的先进测量方案奠定了基础。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Visualizing Standing Light Waves in Continuous-Beam Transmission Electron Microscopy

The phase-resolved imaging of confined light fields by homodyne detection is a cornerstone of metrology in nano-optics and photonics, but its application in electron microscopy has been limited so far. Here, we report the mapping of optical modes in a waveguide structure by illumination with femtosecond light pulses in a continuous-beam transmission electron microscope. Multiphoton photoemission results in a remanent charging pattern which we image by Lorentz microscopy. The resulting image contrast is linked to the intensity distribution of the standing light wave and is quantitatively described within an analytical model. The robustness of the approach is showcased in a wider parameter range and more complex sample geometries including micro- and nanostructures. We discuss further applications of light-interference-based charging for electron microscopy with in situ optical excitation, laying the foundation for advanced measurement schemes for the phase-resolved imaging of propagating light fields.

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来源期刊
ACS Photonics
ACS Photonics NANOSCIENCE & NANOTECHNOLOGY-MATERIALS SCIENCE, MULTIDISCIPLINARY
CiteScore
11.90
自引率
5.70%
发文量
438
审稿时长
2.3 months
期刊介绍: Published as soon as accepted and summarized in monthly issues, ACS Photonics will publish Research Articles, Letters, Perspectives, and Reviews, to encompass the full scope of published research in this field.
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