Jean-René Lèquepeys, Dominique Noguet, Bruno Paing, Xavier Lemoine, Christophe Wyon, Marie-Claire Cyrille, Claire Fenouillet-Béranger, Eric Dupont-Nivet, Chrystel Deguet, Susana Bonnetier
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Europe’s pilot line on fully depleted silicon-on-insulator technology (FAMES)
The FAMES pilot line on fully depleted silicon-on-insulator technology provides a complete toolbox of technologies for the development of innovative chip architectures with increased performance and lower power consumption of mixed-signal circuits.
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