a-IGZO TFTs中伽马射线辐照诱导的降解和捕获行为的低频噪声和直流I-V表征

IF 3.6 2区物理与天体物理 Q2 PHYSICS, APPLIED

Applied Physics Letters Pub Date : 2025-02-11 DOI:10.1063/5.0238211

Hongseung Lee, Jaewook Yoo, Hyeonjun Song, Binhyeong Lee, Soon Joo Yoon, Seongbin Lim, Jo Hak Jeong, Soyeon Kim, Minah Park, Seohyeon Park, Sojin Jung, Bhishma Pandit, Taehwan Moon, Jin-Ha Hwang, Kiyoung Lee, Yoon Kyeung Lee, Keun Heo, Hagyoul Bae

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引用次数: 0

摘要

本文报道了基于非晶铟镓锌氧化物（a-IGZO）薄膜晶体管陷阱行为的伽马射线（γ射线）辐照诱导降解的影响。通过采用低频噪声和直流I-V表征的多种测量配置，我们分别定量研究了a-IGZO通道中子隙态密度的能量分布和栅极绝缘子中氧化陷阱（Not）的空间分布。同时，利用x射线光电子能谱对γ射线辐照后的氧相关缺陷进行定性分析。此外，通过测量击穿电压和对暴露于辐射的制造器件施加正偏置应力进行加速试验，进一步证实了我们结果的有效性。

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Low-frequency noise and DC I–V characterization of gamma-ray irradiation-induced degradation and trap behaviors in a-IGZO TFTs

This work reports the impact of gamma-ray (γ-ray) irradiation-induced degradation based on the trap behaviors in amorphous indium-gallium-zinc-oxide (a-IGZO) thin-film transistors. By employing multiple measurement configurations via low-frequency noise and direct current I–V characterization, we quantitatively investigated the energetic distribution of subgap density-of-states in the a-IGZO channel and the spatial distribution of oxide traps (Not) in the gate insulator, respectively. Also, the qualitative analysis was performed to determine the oxygen-related defects after γ-ray irradiation using x-ray photoelectron spectroscopy. Furthermore, the validity of our results was additionally confirmed by measuring the breakdown voltage and applying positive-bias stress to the fabricated devices exposed to radiation for accelerated tests.

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来源期刊

Applied Physics Letters 物理-物理：应用

CiteScore

6.40

自引率

10.00%

发文量

1821

审稿时长

1.6 months

期刊介绍： Applied Physics Letters (APL) features concise, up-to-date reports on significant new findings in applied physics. Emphasizing rapid dissemination of key data and new physical insights, APL offers prompt publication of new experimental and theoretical papers reporting applications of physics phenomena to all branches of science, engineering, and modern technology. In addition to regular articles, the journal also publishes invited Fast Track, Perspectives, and in-depth Editorials which report on cutting-edge areas in applied physics. APL Perspectives are forward-looking invited letters which highlight recent developments or discoveries. Emphasis is placed on very recent developments, potentially disruptive technologies, open questions and possible solutions. They also include a mini-roadmap detailing where the community should direct efforts in order for the phenomena to be viable for application and the challenges associated with meeting that performance threshold. Perspectives are characterized by personal viewpoints and opinions of recognized experts in the field. Fast Track articles are invited original research articles that report results that are particularly novel and important or provide a significant advancement in an emerging field. Because of the urgency and scientific importance of the work, the peer review process is accelerated. If, during the review process, it becomes apparent that the paper does not meet the Fast Track criterion, it is returned to a normal track.