基于zno的随机数发生器忆阻器：电流符合的情况

IF 0.7 4区工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC

Electronics Letters Pub Date : 2025-02-09 DOI:10.1049/ell2.70165

Zohreh Hajiabadi, Irwan Purnama, Asep Nugroho, Hanyu Cao, Sridhar Chandrasekaran, Husneni Mukhtar, Dimitra G. Georgiadou, Harold M. H. Chong, David B. Thomas, Firman M. Simanjuntak

{"title":"基于zno的随机数发生器忆阻器：电流符合的情况","authors":"Zohreh Hajiabadi, Irwan Purnama, Asep Nugroho, Hanyu Cao, Sridhar Chandrasekaran, Husneni Mukhtar, Dimitra G. Georgiadou, Harold M. H. Chong, David B. Thomas, Firman M. Simanjuntak","doi":"10.1049/ell2.70165","DOIUrl":null,"url":null,"abstract":"<p>This study aims to exploit the resistance states of Cr/ZnO/TiN memristors to generate random numbers. A random number generator (RNG) circuit employing a single memristor is proposed. We suggest that current compliance (CC) is a significant parameter in determining the quality of randomness; it is found that low CCs (20-50 µA) have a wide resistance state distribution that facilitates random bits. This work provides insight into the implementation of memristors for data security applications.</p>","PeriodicalId":11556,"journal":{"name":"Electronics Letters","volume":"61 1","pages":""},"PeriodicalIF":0.7000,"publicationDate":"2025-02-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1049/ell2.70165","citationCount":"0","resultStr":"{\"title\":\"ZnO-based memristor for random number generator: The case of current compliance\",\"authors\":\"Zohreh Hajiabadi, Irwan Purnama, Asep Nugroho, Hanyu Cao, Sridhar Chandrasekaran, Husneni Mukhtar, Dimitra G. Georgiadou, Harold M. H. Chong, David B. Thomas, Firman M. Simanjuntak\",\"doi\":\"10.1049/ell2.70165\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>This study aims to exploit the resistance states of Cr/ZnO/TiN memristors to generate random numbers. A random number generator (RNG) circuit employing a single memristor is proposed. We suggest that current compliance (CC) is a significant parameter in determining the quality of randomness; it is found that low CCs (20-50 µA) have a wide resistance state distribution that facilitates random bits. This work provides insight into the implementation of memristors for data security applications.</p>\",\"PeriodicalId\":11556,\"journal\":{\"name\":\"Electronics Letters\",\"volume\":\"61 1\",\"pages\":\"\"},\"PeriodicalIF\":0.7000,\"publicationDate\":\"2025-02-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://onlinelibrary.wiley.com/doi/epdf/10.1049/ell2.70165\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electronics Letters\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://onlinelibrary.wiley.com/doi/10.1049/ell2.70165\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electronics Letters","FirstCategoryId":"5","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1049/ell2.70165","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}

引用次数: 0

摘要

本研究旨在利用Cr/ZnO/TiN忆阻器的电阻状态来产生随机数。提出了一种采用单忆阻器的随机数发生器电路。我们认为当前顺应性（CC）是决定随机性质量的一个重要参数；发现低CCs（20-50µA）具有宽电阻状态分布，有利于随机位。这项工作为数据安全应用程序的忆阻器的实现提供了深入的见解。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

ZnO-based memristor for random number generator: The case of current compliance

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ZnO-based memristor for random number generator: The case of current compliance

This study aims to exploit the resistance states of Cr/ZnO/TiN memristors to generate random numbers. A random number generator (RNG) circuit employing a single memristor is proposed. We suggest that current compliance (CC) is a significant parameter in determining the quality of randomness; it is found that low CCs (20-50 µA) have a wide resistance state distribution that facilitates random bits. This work provides insight into the implementation of memristors for data security applications.

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来源期刊

Electronics Letters 工程技术-工程：电子与电气

CiteScore

2.70

自引率

0.00%

发文量

268

审稿时长

3.6 months

期刊介绍： Electronics Letters is an internationally renowned peer-reviewed rapid-communication journal that publishes short original research papers every two weeks. Its broad and interdisciplinary scope covers the latest developments in all electronic engineering related fields including communication, biomedical, optical and device technologies. Electronics Letters also provides further insight into some of the latest developments through special features and interviews. Scope As a journal at the forefront of its field, Electronics Letters publishes papers covering all themes of electronic and electrical engineering. The major themes of the journal are listed below. Antennas and Propagation Biomedical and Bioinspired Technologies, Signal Processing and Applications Control Engineering Electromagnetism: Theory, Materials and Devices Electronic Circuits and Systems Image, Video and Vision Processing and Applications Information, Computing and Communications Instrumentation and Measurement Microwave Technology Optical Communications Photonics and Opto-Electronics Power Electronics, Energy and Sustainability Radar, Sonar and Navigation Semiconductor Technology Signal Processing MIMO