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IF 3.7 2区计算机科学 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Antennas and Wireless Propagation Letters Pub Date : 2024-11-11 DOI:10.1109/LAWP.2024.3496084

Yan Wang;Junhao Huang;Qifeng Yu;Changfei Zhou;Wenyu Zhang;Yingsong Li;Hang Wong

引用次数: 0

摘要

这封信通过开发简单的元表面（MS）和混合馈电，介绍了一种多波段低剖面天线。元表面既用作 y 偏振天线的辐射器，又用作 x 偏振天线的人工磁导反射器，通过有效堆叠，在 3.5 GHz 频率下实现了 0.1λ 的低剖面。y 极化天线采用基于 MS 的栅格槽贴片形式，宽频带为 4.03 GHz 至 5.63 GHz（1.6 GHz，33.1%），而 x 极化天线则配置为偶极子形式，双频带为 3.36 GHz 至 3.70 GHz（0.34 GHz，9.6%）和 5.14 GHz 至 5.58 GHz（0.44 GHz，8.2%）。为了实现阻抗匹配并为偶极子天线产生频带凹口，引入了一个有缺陷的接地结构。为了解决 x 偏振天线高频段辐射模式不对准的问题，采用了一个不对称槽，将模式校正 11o。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A Low-Profile Multiband Shared-Aperture Antenna Using Multiplexed Metasurface

This letter introduces a multiband low-profile antenna by developing a simple metasurface (MS) and a hybrid feeding. The MS is reused as both a radiator for the y-polarized antenna and an artificial magnetic conductor reflector for the x-polarized antenna, resulting in a low profile of 0.1λ at 3.5 GHz through effective stacking. The y-polarized antenna takes the form of an MS-based grid-slotted patch with a wide band of 4.03 GHz to 5.63 GHz (1.6 GHz, 33.1%), while the x-polarized antenna is configured as a dipole with dual bands of 3.36 GHz to 3.70 GHz (0.34 GHz, 9.6%) and 5.14 GHz to 5.58 GHz (0.44 GHz, 8.2%). A defected ground structure is introduced to achieve impedance matching and generate a band notch for the dipole antenna. To address the misalignment of radiation patterns in the high-frequency band of the x-polarized antenna, an asymmetrical slot is employed for pattern correction by 11^o.

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来源期刊

IEEE Antennas and Wireless Propagation Letters 工程技术-电信学

CiteScore

8.00

自引率

9.50%

发文量

529

审稿时长

1.0 months

期刊介绍： IEEE Antennas and Wireless Propagation Letters (AWP Letters) is devoted to the rapid electronic publication of short manuscripts in the technical areas of Antennas and Wireless Propagation. These are areas of competence for the IEEE Antennas and Propagation Society (AP-S). AWPL aims to be one of the "fastest" journals among IEEE publications. This means that for papers that are eventually accepted, it is intended that an author may expect his or her paper to appear in IEEE Xplore, on average, around two months after submission.