利用扩展范围高能量分辨率荧光检测对锰中的荧光进行高精度高分辨率测量

IF 5.2 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY
Daniel Sier, Nicholas T. T. Tran, Tony Kirk, Chanh Q. Tran, J. Frederick W. Mosselmans, Sofia Diaz-Moreno, Christopher T. Chantler
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引用次数: 0

摘要

利用x射线吸收光谱、x射线发射光谱和共振非弹性x射线散射(RIXS)技术发展起来的增程高能分辨荧光探测技术(XR-HERFD)成功观测了锰中一颗新型x射线荧光卫星。详细介绍了实验方法、光谱处理和分析,以及如何从HERFD光谱中定义、提取和使用统计信息和结构。还提出了测量和提高XR-HERFD、HERFD和RIXS数据集准确数据不确定度的新方法。这包括固有分辨率的定义,以及相对于原始数据或标准处理,以两倍的倍数改进输出和数据的分辨率。详细介绍了HERFD和RIXS实验中常见的新系统,包括背景减法和弹性布拉格谐波,以及处理它们的方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

High-accuracy high-resolution measurements of fluorescence in manganese using extended-range high-energy-resolution fluorescence detection

High-accuracy high-resolution measurements of fluorescence in manganese using extended-range high-energy-resolution fluorescence detection

The technique of extended-range high-energy-resolution fluorescence detection (XR-HERFD), developed from X-ray absorption spectroscopy, X-ray emission spectroscopy and resonant inelastic X-ray scattering (RIXS), has been used to successfully observe a new X-ray fluorescent satellite in manganese. The experimental methodology, spectral processing and analysis, and how statistical information and structure can be defined, extracted and used from HERFD spectra are detailed. Novel approaches to measure and improve accurate data uncertainty in XR-HERFD, HERFD and RIXS data sets are also presented. This includes definitions of intrinsic resolution and improvements to the resolution of the output and data by a factor of two relative to raw data or standard processing. Novel systematics common in HERFD and RIXS experiments are detailed, including background subtraction and elastic Bragg harmonics, with approaches to dealing with them.

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来源期刊
Journal of Applied Crystallography
Journal of Applied Crystallography CHEMISTRY, MULTIDISCIPLINARYCRYSTALLOGRAPH-CRYSTALLOGRAPHY
CiteScore
7.80
自引率
3.30%
发文量
178
期刊介绍: Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.
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