退火对双峰非均匀展宽GaAsBi/GaAs量子点光致发光热猝灭的影响

IF 2.7 Q2 PHYSICS, CONDENSED MATTER
S. Zouaghi , A. Ben Abdelwahed , H. Fitouri , W.S. Alharbi , A. Rebey
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引用次数: 0

摘要

通过光致发光(PL)测量,研究了常压金属有机气相外延(AP-MOVPE)在p-GaAs衬底上生长并在不同温度下退火的具有双峰尺寸分布的GaAsBi/GaAs量子点(QDs)样品。综合发光强度的Arrhenius拟合分析显示了两种类型的非辐射复合过程,描述了发光强的热猝灭。与退火的QD样品相比,生长样品的热猝灭明显更快。这归因于非辐射Bi配合物的密度较高以及与GaAs基体晶格相关的天然缺陷。退火样品中较大量子点增加的活化能值表明限制势深度的改变。小量子点的发光峰能量随温度变化呈s型变化,而发光线宽度则呈非单调形式。这些行为在退火样品中逐渐减少。这些实验结果在不同量子点之间的热激活载流子转移过程中得到了解释。因此,退火降低了局域态密度,从而提高了GaAsBi/GaAs量子点的光学质量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Influence of annealing on the thermal quenching of photoluminescence in GaAsBi/GaAs quantum dots with bimodal inhomogeneous broadening
GaAsBi/GaAs quantum dots (QDs) samples with a bimodal size distribution grown by atmospheric pressure metalorganic vapor phase epitaxy (AP-MOVPE) on p-GaAs substrates and annealed at different temperatures were investigated by photoluminescence (PL) measurements. The analyses of the Arrhenius fit of the integrated PL intensity show two types of non-radiative recombination processes, describing the strong thermal quenching of PL. The thermal quenching of the as-grown sample is clearly quicker compared to the annealed QD samples. It is attributed to a higher density of non-radiative Bi complexes and native defects related to GaAs host lattice. The activation energy value for the large QD increases in the annealed samples suggests a modification in the depth of the confining potential. The temperature dependence of the PL peak energy of small QD presents an S-shape variation, while the PL line width follows a non-monotonic form. These behaviors have been progressively reduced in the annealed samples. These experimental results have been interpreted in the context of the thermally activated carrier transfer process between different QDs. Thus, annealing reduces the localized state density and therefore improves the optical quality of GaAsBi/GaAs QDs.
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CiteScore
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