超频下Verilog-AMS IBIS模型的仿真优化方法

IF 2.2 3区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Yafei Ning , Zirui Zhang , Yuan Dong , Ziqi Zhang , Yuhan Xia
{"title":"超频下Verilog-AMS IBIS模型的仿真优化方法","authors":"Yafei Ning ,&nbsp;Zirui Zhang ,&nbsp;Yuan Dong ,&nbsp;Ziqi Zhang ,&nbsp;Yuhan Xia","doi":"10.1016/j.vlsi.2025.102364","DOIUrl":null,"url":null,"abstract":"<div><div>The Input/Output Buffer Information Specification (IBIS) model has effectively described the electrical characteristics of circuit input and output ports while safeguarding intellectual property. This model focuses on the analysis of the analog behavior of digital integrated circuits, specifically focusing on the electrical characteristic of I/O buffers, by considering the voltage and current waveforms of the digital I/O signals. However, under overclocking conditions, the model experiences distortion and reduced accuracy due to decreased circuit stability. To address this limitation, we introduce an optimized model designed to resist simulation distortions in the IBIS model during overclocking. First, we defined the relevant variables based on the IBIS circuit and constructed a physical model framework. Next, we studied the monotonicity and sufficient conditions of the physical model, established the relationship between model output and variable parameters, and derived the corresponding IBIS mathematical relationship. Then, to address distortion under overclocking conditions, we adjusted the model variables by setting weighting coefficients tailored to different scenarios, ensuring the output values were closer to the baseline model and significantly enhancing the model's resilience against overclocking distortions. Extensive optimization experiments on three different devices confirm the general applicability of our proposed method, achieving optimization rates exceeding 90 % while maintaining high consistency with the TL baseline model. Notably, our approach improves overclocking simulation accuracy by 21.7 % with only a 2.2 % increase in CPU time, surpassing existing methods. This work addresses the IBIS model's overclocking distortion issue, significantly advancing the accuracy of circuit device simulations.</div></div>","PeriodicalId":54973,"journal":{"name":"Integration-The Vlsi Journal","volume":"102 ","pages":"Article 102364"},"PeriodicalIF":2.2000,"publicationDate":"2025-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A simulation optimization method for Verilog-AMS IBIS model under overclocking\",\"authors\":\"Yafei Ning ,&nbsp;Zirui Zhang ,&nbsp;Yuan Dong ,&nbsp;Ziqi Zhang ,&nbsp;Yuhan Xia\",\"doi\":\"10.1016/j.vlsi.2025.102364\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>The Input/Output Buffer Information Specification (IBIS) model has effectively described the electrical characteristics of circuit input and output ports while safeguarding intellectual property. This model focuses on the analysis of the analog behavior of digital integrated circuits, specifically focusing on the electrical characteristic of I/O buffers, by considering the voltage and current waveforms of the digital I/O signals. However, under overclocking conditions, the model experiences distortion and reduced accuracy due to decreased circuit stability. To address this limitation, we introduce an optimized model designed to resist simulation distortions in the IBIS model during overclocking. First, we defined the relevant variables based on the IBIS circuit and constructed a physical model framework. Next, we studied the monotonicity and sufficient conditions of the physical model, established the relationship between model output and variable parameters, and derived the corresponding IBIS mathematical relationship. Then, to address distortion under overclocking conditions, we adjusted the model variables by setting weighting coefficients tailored to different scenarios, ensuring the output values were closer to the baseline model and significantly enhancing the model's resilience against overclocking distortions. Extensive optimization experiments on three different devices confirm the general applicability of our proposed method, achieving optimization rates exceeding 90 % while maintaining high consistency with the TL baseline model. Notably, our approach improves overclocking simulation accuracy by 21.7 % with only a 2.2 % increase in CPU time, surpassing existing methods. This work addresses the IBIS model's overclocking distortion issue, significantly advancing the accuracy of circuit device simulations.</div></div>\",\"PeriodicalId\":54973,\"journal\":{\"name\":\"Integration-The Vlsi Journal\",\"volume\":\"102 \",\"pages\":\"Article 102364\"},\"PeriodicalIF\":2.2000,\"publicationDate\":\"2025-01-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Integration-The Vlsi Journal\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0167926025000215\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Integration-The Vlsi Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0167926025000215","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0

摘要

输入/输出缓冲信息规范(IBIS)模型在保护知识产权的同时,有效地描述了电路输入和输出端口的电气特性。该模型侧重于分析数字集成电路的模拟行为,特别是通过考虑数字I/O信号的电压和电流波形来关注I/O缓冲器的电气特性。然而,在超频条件下,由于电路稳定性下降,模型会出现失真和精度降低。为了解决这一限制,我们引入了一个优化模型,旨在抵抗IBIS模型在超频期间的仿真失真。首先,基于IBIS电路定义相关变量,构建物理模型框架;其次,研究了物理模型的单调性和充分条件,建立了模型输出与变量参数之间的关系,并推导出相应的IBIS数学关系。然后,为了解决超频条件下的失真问题,我们通过设置针对不同场景的权重系数来调整模型变量,确保输出值更接近基线模型,并显着增强模型对超频失真的弹性。在三种不同设备上进行的大量优化实验证实了我们提出的方法的一般适用性,在与TL基线模型保持高度一致性的同时,优化率超过90%。值得注意的是,我们的方法将超频模拟精度提高了21.7%,而CPU时间仅增加了2.2%,超过了现有方法。这项工作解决了IBIS模型的超频失真问题,显著提高了电路器件仿真的准确性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A simulation optimization method for Verilog-AMS IBIS model under overclocking
The Input/Output Buffer Information Specification (IBIS) model has effectively described the electrical characteristics of circuit input and output ports while safeguarding intellectual property. This model focuses on the analysis of the analog behavior of digital integrated circuits, specifically focusing on the electrical characteristic of I/O buffers, by considering the voltage and current waveforms of the digital I/O signals. However, under overclocking conditions, the model experiences distortion and reduced accuracy due to decreased circuit stability. To address this limitation, we introduce an optimized model designed to resist simulation distortions in the IBIS model during overclocking. First, we defined the relevant variables based on the IBIS circuit and constructed a physical model framework. Next, we studied the monotonicity and sufficient conditions of the physical model, established the relationship between model output and variable parameters, and derived the corresponding IBIS mathematical relationship. Then, to address distortion under overclocking conditions, we adjusted the model variables by setting weighting coefficients tailored to different scenarios, ensuring the output values were closer to the baseline model and significantly enhancing the model's resilience against overclocking distortions. Extensive optimization experiments on three different devices confirm the general applicability of our proposed method, achieving optimization rates exceeding 90 % while maintaining high consistency with the TL baseline model. Notably, our approach improves overclocking simulation accuracy by 21.7 % with only a 2.2 % increase in CPU time, surpassing existing methods. This work addresses the IBIS model's overclocking distortion issue, significantly advancing the accuracy of circuit device simulations.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
Integration-The Vlsi Journal
Integration-The Vlsi Journal 工程技术-工程:电子与电气
CiteScore
3.80
自引率
5.30%
发文量
107
审稿时长
6 months
期刊介绍: Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信