4:1 MUX APUF架构在zynq7000 SoC FPGA上的性能分析

IF 2.2 3区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Kaveri Hatti, C. Paramasivam
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引用次数: 0

摘要

物理不可克隆功能(PUF)是一种从集成电路脆弱的物理元件中获取数据的物理系统。这些系统提供了一种高度安全的方式来为加密操作生成加密密钥,并保护安全ip免受威胁、操纵和复制,因为它们具有不可克隆性。先前的文献已经设计了各种具有2:1 MUX的Arbiter puf,但是它们消耗很大的面积来产生更大的响应位。根据我们的文献调查,这是第一篇设计具有4:1 MUX的Arbiter PUF的论文,它减少了面积开销。本文利用LUT6原语在10个ZYNQ-7000 SoC FPGA器件上实现了4:1MUX APUF设计,克服了在FPGA器件上设计无偏PUF架构的挑战。该研究还提出了两种不同的方法来生成4:1 MUX Arbiter PUF相应挑战的响应。当用两种方法评估时,该设计的唯一性率为49%。温度波动(20-70°C)的可靠性百分比为99%。最后,提出的PUF的性能参数是最先进的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Performance analysis of 4:1 MUX APUF Architecture Implemented on Zynq 7000 SoC FPGA
Physical unclonable functions (PUF) are a type of physical system that harvests data from integrated circuits fragile physical components. These systems offer a highly secure way to generate cryptographic keys for cryptographic operations and protect secure IPs from threats, manipulation, and duplication due to their un-clonability properties. Prior literature has designed various Arbiter PUFs with 2:1 MUX, but they consume a large area to generate the larger response bits. Based on our literature survey, this is the first paper to design an Arbiter PUF with 4:1 MUX, which reduces the area overhead. This paper utilizes a 4:1MUX APUF design is implemented on 10 ZYNQ-7000 SoC FPGA devices using the LUT6 primitive to overcome the challenge of designing an unbiased PUF architecture on the FPGA device. The study also presents two different methodologies to generate responses for the corresponding challenge of 4:1 MUX Arbiter PUF. The design showed a uniqueness rate of 49 % when evaluated on both methodologies. The dependability percentages for temperature fluctuations (20–70 °C) were 99 %. Finally, the performance parameter of the proposed PUF is state-of-the-art.
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来源期刊
Integration-The Vlsi Journal
Integration-The Vlsi Journal 工程技术-工程:电子与电气
CiteScore
3.80
自引率
5.30%
发文量
107
审稿时长
6 months
期刊介绍: Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.
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