补偿探头位置对带电导体测量电位值的影响

IF 1.9 4区工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

Journal of Electrostatics Pub Date : 2025-01-04 DOI:10.1016/j.elstat.2024.104028

Adam Pelesz

{"title":"补偿探头位置对带电导体测量电位值的影响","authors":"Adam Pelesz","doi":"10.1016/j.elstat.2024.104028","DOIUrl":null,"url":null,"abstract":"<div><div>The article presents how the position of a compensation probe affects the measured potential of a conductive object with constant charge. This influence is usually difficult to predict and requires a numerical analysis. Simulations have been carried out to show to what extent a compensation probe can affect the potential of an object. It was shown that the location of the probe can noticeably affect the value of the measured potential of a conducting object with constant charge <em>Q</em>. Article also introduces the concept of an auxiliary surface <em>S</em><sub>pu</sub> that can assist in identifying the optimal placement of the probe.</div></div>","PeriodicalId":54842,"journal":{"name":"Journal of Electrostatics","volume":"134 ","pages":"Article 104028"},"PeriodicalIF":1.9000,"publicationDate":"2025-01-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Effect of the compensation probe position on the value of the measured potential of a conducting object with constant charge\",\"authors\":\"Adam Pelesz\",\"doi\":\"10.1016/j.elstat.2024.104028\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>The article presents how the position of a compensation probe affects the measured potential of a conductive object with constant charge. This influence is usually difficult to predict and requires a numerical analysis. Simulations have been carried out to show to what extent a compensation probe can affect the potential of an object. It was shown that the location of the probe can noticeably affect the value of the measured potential of a conducting object with constant charge <em>Q</em>. Article also introduces the concept of an auxiliary surface <em>S</em><sub>pu</sub> that can assist in identifying the optimal placement of the probe.</div></div>\",\"PeriodicalId\":54842,\"journal\":{\"name\":\"Journal of Electrostatics\",\"volume\":\"134 \",\"pages\":\"Article 104028\"},\"PeriodicalIF\":1.9000,\"publicationDate\":\"2025-01-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Electrostatics\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0304388624001359\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Electrostatics","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0304388624001359","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}

引用次数: 0

摘要

本文介绍了补偿探头的位置如何影响带恒定电荷的导电物体的测量电位。这种影响通常难以预测，需要进行数值分析。仿真已经进行，以显示补偿探头可以影响到什么程度的潜力的对象。结果表明，探针的位置可以显著地影响带恒定电荷q的导电物体的测量电位值。文章还介绍了辅助表面Spu的概念，它可以帮助确定探针的最佳位置。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Effect of the compensation probe position on the value of the measured potential of a conducting object with constant charge

The article presents how the position of a compensation probe affects the measured potential of a conductive object with constant charge. This influence is usually difficult to predict and requires a numerical analysis. Simulations have been carried out to show to what extent a compensation probe can affect the potential of an object. It was shown that the location of the probe can noticeably affect the value of the measured potential of a conducting object with constant charge Q. Article also introduces the concept of an auxiliary surface S_pu that can assist in identifying the optimal placement of the probe.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Journal of Electrostatics 工程技术-工程：电子与电气

CiteScore

4.00

自引率

11.10%

发文量

审稿时长

49 days

期刊介绍： The Journal of Electrostatics is the leading forum for publishing research findings that advance knowledge in the field of electrostatics. We invite submissions in the following areas: Electrostatic charge separation processes. Electrostatic manipulation of particles, droplets, and biological cells. Electrostatically driven or controlled fluid flow. Electrostatics in the gas phase.