基于ald封装Ga2O3:Cr DBR微腔的精确、鲁棒宽量程发光微温度计抛光工艺。1/2025)

IF 6.4 3区材料科学 Q1 MATERIALS SCIENCE, MULTIDISCIPLINARY

Advanced Materials Technologies Pub Date : 2025-01-08 DOI:10.1002/admt.202570001

Manuel Alonso-Orts, Ruben J. T. Neelissen, Daniel Carrasco, Marco Schowalter, Andreas Rosenauer, Emilio Nogales, Bianchi Méndez, Martin Eickhoff

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引用次数: 0

摘要

发光测温原子层沉积（ALD）技术是一种在微丝端部实现光滑、坚固的分布式布拉格反射器（DBR）涂层的有效技术。在第2400881号文章中，Manuel Alonso-Orts和他的同事们用ald涂层、掺杂铬的氧化镓（Ga2O3:Cr）微线创建了光学微腔，并演示了它们在高稳定性、高精度和准确性的宽范围温度传感器中的应用，以监测温度引起的谐振峰的光谱位移。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

Accurate and Robust Wide-Range Luminescent Microthermometer Based on ALD-Encapsulated Ga2O3:Cr DBR Microcavities (Adv. Mater. Technol. 1/2025)

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Accurate and Robust Wide-Range Luminescent Microthermometer Based on ALD-Encapsulated Ga2O3:Cr DBR Microcavities (Adv. Mater. Technol. 1/2025)

Luminescence Thermometry

Atomic layer deposition (ALD) is a powerful technique for achieving smooth and robust distributed Bragg reflector (DBR) coatings on microwire ends. In article number 2400881, Manuel Alonso-Orts and co-workers create optical microcavities with ALD-coated, chromium-doped gallium oxide (Ga₂O₃:Cr) microwires and demonstrate their use for wide-range temperature sensors with high stability, precision and accuracy, monitoring the temperature-induced spectral shifts of the resonant peaks.

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来源期刊

Advanced Materials Technologies Materials Science-General Materials Science

CiteScore

10.20

自引率

4.40%

发文量

566

期刊介绍： Advanced Materials Technologies Advanced Materials Technologies is the new home for all technology-related materials applications research, with particular focus on advanced device design, fabrication and integration, as well as new technologies based on novel materials. It bridges the gap between fundamental laboratory research and industry.