基于石墨烯/SOI平台的被动矩阵肖特基势垒二维光电二极管阵列

IF 2.8 4区 材料科学 Q3 MATERIALS SCIENCE, MULTIDISCIPLINARY
Alper Yanilmaz, Özhan Ünverdi, Cem Çelebi
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引用次数: 0

摘要

我们在绝缘体上硅(SOI)衬底上用单层石墨烯和n型硅(n-Si)电极制作了4 × 4像素二维(2D)光电二极管阵列(PDA)。我们的器件设计基于无源矩阵传感器阵列架构,由相互垂直排列的单个石墨烯和硅电极组成。在室温下进行I-V测量,以揭示石墨烯和硅结在器件结构中的电子特性。通过波长分辨和时间相关的光电流光谱测量,确定了阵列中每个G/Si像素的光谱响应率、响应速度和光串扰。通过微拉曼映射测量来检测石墨烯电极在每个像素上的表面覆盖率。微拉曼测图结果与光照下获得的相应光电流数据相关联。我们相信,这项工作在将各种2D材料和SOI技术集成到下一代图像传感和多像素光检测应用中具有重大潜力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Passive matrix Schottky barrier 2D photodiode array on graphene/SOI platform

We fabricated 4 × 4 pixel two-dimensional (2D) photodiode array (PDA) out of monolayer graphene and n-type silicon (n-Si) electrodes on a silicon-on-insulator (SOI) substrate. Our device design is based on passive matrix sensor array architecture consisting of individual graphene and silicon electrodes aligned perpendicular to each other. I-V measurements conducted at room temperature to reveal the electronic characteristics of graphene and Si junction in the device structure. The spectral responsivity, respond speed and the optical crosstalk of each G/Si pixels in the array have been determined by wavelength resolved and time dependent photocurrent spectroscopy measurements. Micro-Raman mapping measurements were conducted to examine the surface coverage of graphene electrode on each pixel. The results of Micro-Raman mapping measurements were correlated with the corresponding photocurrent data acquired under light illumination. We believe that this work constitutes a significant potential in integrating variety of 2D materials and SOI technology into next generation image sensing and multiple pixel light detection applications.

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来源期刊
Applied Physics A
Applied Physics A 工程技术-材料科学:综合
CiteScore
4.80
自引率
7.40%
发文量
964
审稿时长
38 days
期刊介绍: Applied Physics A publishes experimental and theoretical investigations in applied physics as regular articles, rapid communications, and invited papers. The distinguished 30-member Board of Editors reflects the interdisciplinary approach of the journal and ensures the highest quality of peer review.
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