环形内壁三维形状测量方法及系统标定。

IF 3.3 2区 物理与天体物理 Q2 OPTICS
Optics express Pub Date : 2025-01-27 DOI:10.1364/OE.546804
Baichun Zhagn, Yifan Jiang, Qingyang Wu, Qican Zhang
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引用次数: 0

摘要

在工业测量领域,捕获环形内壁的三维(3D)轮廓一直是一个重大挑战。目前的方法通常需要使用3D扫描仪或圆形结构光技术进行多次扫描,这是低效且不方便使用的。针对这一问题,本文提出了一种基于圆条纹投影的离轴测量方法和相应的系统。它可以在一次扫描中重建环形内壁的360°轮廓,而不需要任何移动。此外,本文还提出了一种基于光线追踪的全场标定方法。与传统方法相比,该方法校准结构简单,操作方便,不需要严格的同轴对准,增强了测量系统的灵活性,提高了测量系统的效率和输出数据的完整性。仿真和实验结果验证了该测量方法和系统标定方法的有效性和实用性,为环空内壁三维轮廓自动测量提供了另一种解决方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Three-dimensional shape measurement method and system calibration for an annular inner-wall.

In the field of industrial measurement, capturing a three-dimensional (3D) profile of an annular inner-wall has been a significant challenge. Current methods typically require multiple scans using a 3D scanner or circular structured light technique, which are inefficient and inconvenient to use. To address this issue, an off-axis measurement method and corresponding system has been proposed in this paper based on circular fringe projection. It can be used to reconstruct the 360° profile of an annular inner-wall in a single scan without any movement. Additionally, a full-field calibration method using ray-tracing for this system has also been presented. Compared to the traditional methods, this method features a simple calibration structure, convenient operation and no need for strict coaxial alignment, which enhances the flexibility of the proposed measurement system and contributes to its high efficiency and the integrity of its output data. Simulation and experimental results confirm the effectiveness and practicality of this measuring approach and system calibration method, providing an alternative solution for automated 3D profile measurement of annular inner-wall.

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来源期刊
Optics express
Optics express 物理-光学
CiteScore
6.60
自引率
15.80%
发文量
5182
审稿时长
2.1 months
期刊介绍: Optics Express is the all-electronic, open access journal for optics providing rapid publication for peer-reviewed articles that emphasize scientific and technology innovations in all aspects of optics and photonics.
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