一种用于LTCC的新型BaMgSi4O10微波介电陶瓷

IF 2.8 4区工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC

Journal of Materials Science: Materials in Electronics Pub Date : 2025-01-21 DOI:10.1007/s10854-024-14130-x

Zhenli Luo, Yiyang Cai, Changzhi Yin, Mingfei Cheng, Weicheng Lei, Wenzhong Lu, Xiaoqiang Song, Wen Lei

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引用次数: 0

摘要

采用传统的固态法制备了一种新型BaMgSi4O10陶瓷。在所有成分中均检测到BaMgSi4O10、BaMgSiO5、Ba2MgSi2O7和SiO2。在1100℃时，获得了εr = 5.7, Q × f = 17,900 GHz, τf = - 19.1 ppm/°C的微波介电特性。为了满足LTCC技术的要求，采用2 wt% LMS玻璃组成的最佳温度可低于850℃，浸泡时间短，为0.5 h。采用bamgsi4010 -2 wt% LMS作为衬底制备了贴片天线，该贴片天线在4.12 GHz下带宽为120 MHz。结果表明，BaMgSi4O10-2 wt% LMS陶瓷在无线通信系统中具有广阔的应用前景。

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A novel BaMgSi4O10 microwave dielectric ceramic for LTCC application

A novel BaMgSi₄O₁₀ ceramic was fabricated using a conventional solid-state method. The BaMgSi₄O₁₀ accompanied with BaMgSiO₅, Ba₂MgSi₂O₇, and SiO₂ was detected for all compositions. Furthermore, microwave dielectric properties with ε_r = 5.7_, Q × f = 17,900 GHz, and τ_f = − 19.1 ppm/°C were obtained at 1100 °C. To meet the requirement of LTCC technology, the optimum temperature can be lower than 850 °C by composing with 2 wt% LMS glass with a short soaking time of 0.5 h. A patch antenna was fabricated using BaMgSi₄O₁₀-2 wt% LMS as the substrate with a bandwidth of 120 MHz at 4.12 GHz. All result indicates BaMgSi₄O₁₀-2 wt% LMS ceramic has large application prospect in wireless communication systems.

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来源期刊

Journal of Materials Science: Materials in Electronics 工程技术-材料科学：综合

CiteScore

5.00

自引率

7.10%

发文量

1931

审稿时长

2 months

期刊介绍： The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.