结构演变对共沉淀ZrO2纳米粒子光学和电子性能的影响

IF 2.8 4区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC
S. Sankar, Lini Jose
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引用次数: 0

摘要

以氯化氧锆为前驱体,EDTA为封盖剂,氢氧化钠和去离子水为溶剂,采用共沉淀法制备二氧化锆纳米颗粒。将合成的NPs在673 ~ 1273 K的不同温度下进行退火。利用XRD、Raman和FTIR分析了退火温度对结构演变的影响。退火至673 K的样品是无定形的。进一步退火形成了具有四方相的晶体结构。在1073 K以上退火后,它变成由四方相和单斜相组成的多晶。在更高的温度下退火导致单斜相结晶。形态学研究采用FESEM分析。晶粒尺寸分布受退火温度的影响较大。多晶相颗粒的形貌均匀,粒径为10 ~ 20 nm,分布均匀。利用紫外-可见光谱法对其进行了光吸收和带隙改性研究。利用光致发光技术研究了纳米粒子在退火温度下电子激发能级的变化和缺陷的形成。研究了ZrO2纳米粒子的结构和形态变化对其光学和电子性能的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Effect of structural evolutions on optical and electronic properties of co-precipitated ZrO2 nanoparticles

Zirconium dioxide (ZrO2) nanoparticles are prepared by co-precipitation method using zirconium oxychloride as the precursor, EDTA as the capping agent, sodium hydroxide and deionized water as the solvent. The synthesized NPs were annealed at different temperatures ranging from 673 to 1273 K. Structural evolutions as a function of annealing temperature are analyzed using XRD, Raman and FTIR analysis. Samples annealed up to 673 K are found to be amorphous. Further annealing resulted in the formation of crystalline structure with tetragonal phase. It turned to polycrystalline comprising both tetragonal and monoclinic phase after annealing above 1073 K. Annealing at further higher temperature resulted in crystallization in monoclinic phase. Morphological studies are conducted using FESEM analysis. The particle size distribution is found to be strongly influenced by annealing temperature. A uniform morphology with adequate distribution of nanosized particles of size 10–20 nm is achieved for particles of polycrystalline phase. Optical absorption and bandgap modification studies were conducted using UV–Visible spectroscopy. Modifications in electronic excitation levels and formation of defects as a function of annealing temperature, in the nanoparticles synthesized, were investigated using photoluminescent studies. The effect of structural and morphological evolutions, with annealing temperature, on optical and electronic properties of ZrO2 nanoparticles are studied in detail.

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来源期刊
Journal of Materials Science: Materials in Electronics
Journal of Materials Science: Materials in Electronics 工程技术-材料科学:综合
CiteScore
5.00
自引率
7.10%
发文量
1931
审稿时长
2 months
期刊介绍: The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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