{"title":"有线应用中源退化差分对的线性分析","authors":"Kunal Yadav;Ping-Hsuan Hsieh;Anthony Chan Carusone","doi":"10.1109/OJCAS.2024.3507543","DOIUrl":null,"url":null,"abstract":"This paper presents a comprehensive analysis of nonlinearities in differential pairs with source degeneration and their impact on wireline communication applications. We assess the suitability of three nonlinearity metrics to quantify the receiver analog front-end performance. This work identifies the primary sources of nonlinearity in differential pair circuits including, broadband Variable Gain Amplifiers (VGAs) and Continuous-Time Linear Equalizers (CTLEs) using circuit simulations. Furthermore, the linearity performance of different front-end configurations is evaluated, providing design insights. The analysis is validated through simulations with a 22-nm FDSOI technology.","PeriodicalId":93442,"journal":{"name":"IEEE open journal of circuits and systems","volume":"6 ","pages":"26-37"},"PeriodicalIF":2.4000,"publicationDate":"2024-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10769573","citationCount":"0","resultStr":"{\"title\":\"Linearity Analysis of Source-Degenerated Differential Pairs for Wireline Applications\",\"authors\":\"Kunal Yadav;Ping-Hsuan Hsieh;Anthony Chan Carusone\",\"doi\":\"10.1109/OJCAS.2024.3507543\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a comprehensive analysis of nonlinearities in differential pairs with source degeneration and their impact on wireline communication applications. We assess the suitability of three nonlinearity metrics to quantify the receiver analog front-end performance. This work identifies the primary sources of nonlinearity in differential pair circuits including, broadband Variable Gain Amplifiers (VGAs) and Continuous-Time Linear Equalizers (CTLEs) using circuit simulations. Furthermore, the linearity performance of different front-end configurations is evaluated, providing design insights. The analysis is validated through simulations with a 22-nm FDSOI technology.\",\"PeriodicalId\":93442,\"journal\":{\"name\":\"IEEE open journal of circuits and systems\",\"volume\":\"6 \",\"pages\":\"26-37\"},\"PeriodicalIF\":2.4000,\"publicationDate\":\"2024-11-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10769573\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE open journal of circuits and systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10769573/\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE open journal of circuits and systems","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/10769573/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Linearity Analysis of Source-Degenerated Differential Pairs for Wireline Applications
This paper presents a comprehensive analysis of nonlinearities in differential pairs with source degeneration and their impact on wireline communication applications. We assess the suitability of three nonlinearity metrics to quantify the receiver analog front-end performance. This work identifies the primary sources of nonlinearity in differential pair circuits including, broadband Variable Gain Amplifiers (VGAs) and Continuous-Time Linear Equalizers (CTLEs) using circuit simulations. Furthermore, the linearity performance of different front-end configurations is evaluated, providing design insights. The analysis is validated through simulations with a 22-nm FDSOI technology.
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