{"title":"随机照明显微镜:更快,更厚,和像差不敏感","authors":"","doi":"10.1038/s41377-024-01687-9","DOIUrl":null,"url":null,"abstract":"<p>The Extended Depth of Field (EDF) approach has been combined with Random Illumination Microscopy (RIM) to realize aberration-insensitive, fast super-resolution imaging with extended depth, which is a promising tool for dynamic imaging in larger and thicker live cells and tissues.</p>","PeriodicalId":18069,"journal":{"name":"Light-Science & Applications","volume":"23 1","pages":""},"PeriodicalIF":20.6000,"publicationDate":"2025-01-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Random Illumination Microscopy: faster, thicker, and aberration-insensitive\",\"authors\":\"\",\"doi\":\"10.1038/s41377-024-01687-9\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>The Extended Depth of Field (EDF) approach has been combined with Random Illumination Microscopy (RIM) to realize aberration-insensitive, fast super-resolution imaging with extended depth, which is a promising tool for dynamic imaging in larger and thicker live cells and tissues.</p>\",\"PeriodicalId\":18069,\"journal\":{\"name\":\"Light-Science & Applications\",\"volume\":\"23 1\",\"pages\":\"\"},\"PeriodicalIF\":20.6000,\"publicationDate\":\"2025-01-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Light-Science & Applications\",\"FirstCategoryId\":\"1089\",\"ListUrlMain\":\"https://doi.org/10.1038/s41377-024-01687-9\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"OPTICS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Light-Science & Applications","FirstCategoryId":"1089","ListUrlMain":"https://doi.org/10.1038/s41377-024-01687-9","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"OPTICS","Score":null,"Total":0}
Random Illumination Microscopy: faster, thicker, and aberration-insensitive
The Extended Depth of Field (EDF) approach has been combined with Random Illumination Microscopy (RIM) to realize aberration-insensitive, fast super-resolution imaging with extended depth, which is a promising tool for dynamic imaging in larger and thicker live cells and tissues.