环境气体分子诱导滑动铁电的降解:以双层WS2为例

IF 12.1 2区 材料科学 Q1 CHEMISTRY, MULTIDISCIPLINARY
Small Pub Date : 2024-12-29 DOI:10.1002/smll.202411307
Chengfeng Pan, Dazhong Sun, Xianghong Niu, Yu-Ning Wu
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引用次数: 0

摘要

新兴的滑动铁电(SF)在开发低能耗、高寿命的铁电器件方面具有巨大的潜力。在晶体的范德华(vdWs)叠层中,原子空位不可避免地存在,气体分子通常停留在中间层,但它们对晶体的影响尚不清楚。本文以双分子层WS2为例,研究了其对SF极化和开关势垒的影响。硫空位(SV)对极化有轻微影响,但SV周围的W原子倾向于化学吸附vdWs间隙中的O2分子,在室温下O2分子可能进一步解离成单独的化学吸附的O原子。吸附的氧导致极化和开关势垒的降低,最终导致SF性能的退化。此外,吸附的氧还会改变基于sf的晶体管中的肖特基势垒,并缩小存储窗口,从而导致器件的退化。这些影响可能随着时间的推移而累积,最终导致设备性能下降。这项工作提供了一个微观的洞察缺陷/杂质对SF的影响,有利于优化基于SF的器件的性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Degradation of Sliding Ferroelectricity Induced by Environmental Gas Molecules: Case of Bilayer WS2

Degradation of Sliding Ferroelectricity Induced by Environmental Gas Molecules: Case of Bilayer WS2

Degradation of Sliding Ferroelectricity Induced by Environmental Gas Molecules: Case of Bilayer WS2

Emerging sliding ferroelectricity (SF) holds great potential for the development of low-energy-cost and high-endurance ferroelectric devices. In the van der Waals (vdWs) stacking of SF, atomic vacancies inevitably exist and gas molecules commonly stay in the interlayer, but their impact on SF is unclear. In this work, the bilayer WS2 is taken as an example and demonstrate their effect on the SF polarization and switching barrier. The sulfur vacancy (SV) is found to slightly impair polarization, but the W atoms around the SV tend to chemically adsorb O2 molecules in the vdWs gap, which can possibly further dissociate into separately chemisorbed O atoms at room temperature. The adsorbed oxygen causes the reduction of polarization and switching barrier, eventually inducing the degradation of SF properties. In addition, the adsorbed oxygen also modifies the Schottky barriers in SF-based transistors and narrows the memory window, leading to the degradation of the devices. These effects may accumulate over time and eventually result in degraded device performance. This work provides a microscopic insight into the effect of defects/impurities on SF, favoring optimizing the performance of SF-based devices.

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来源期刊
Small
Small 工程技术-材料科学:综合
CiteScore
17.70
自引率
3.80%
发文量
1830
审稿时长
2.1 months
期刊介绍: Small serves as an exceptional platform for both experimental and theoretical studies in fundamental and applied interdisciplinary research at the nano- and microscale. The journal offers a compelling mix of peer-reviewed Research Articles, Reviews, Perspectives, and Comments. With a remarkable 2022 Journal Impact Factor of 13.3 (Journal Citation Reports from Clarivate Analytics, 2023), Small remains among the top multidisciplinary journals, covering a wide range of topics at the interface of materials science, chemistry, physics, engineering, medicine, and biology. Small's readership includes biochemists, biologists, biomedical scientists, chemists, engineers, information technologists, materials scientists, physicists, and theoreticians alike.
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