{"title":"通过同时使用标准和高分辨率微 PIXE 光谱分析镉和银团簇","authors":"Iva Božičević Mihalić , Anja Mioković , Masedi Carington Masekane , Stjepko Fazinić","doi":"10.1016/j.radphyschem.2024.112480","DOIUrl":null,"url":null,"abstract":"<div><div>Particle Induced X-ray Emission (PIXE) spectroscopy is now a mainstay in Ion Beam Analysis (IBA) and is applicable across several scientific disciplines requiring high sensitivity for detecting constituent elements in a material. While the technique is well established, the use of conventional broad-band spectrometers limits the ability for X-ray line separation for closely lying characteristic energies. The inability to separate closely lying X-ray lines using standard silicon detectors with resolution >120 eV FWHM (for Mn Kα) especially hinders quantitation in varying applications. One such limitation is the separation of Ag and Cd L-shell X-ray lines, the extraction of which is often needed for accurate concentration measurements. While this limitation may be circumvented by using higher proton energies (>15 MeV) for Ag and Cd K-shell excitation, accurate computation may still be constrained by the lack of X-ray production cross section data, as cross sections predicted by theory are only widely validated up to 3 MeV. The present work demonstrates a simultaneous use of high-resolution and standard PIXE spectroscopy using 2 MeV proton beams for the measurement of relative Ag and Cd L-shell concentration ratios, along with the use of multivariate analysis of PIXE spectral images. Ag and Cd concentration ratios analysed using GUPIXWIN for standard PIXE and a Wavelength Dispersive X-ray Spectrometer (WDX) are compared and discussed.</div></div>","PeriodicalId":20861,"journal":{"name":"Radiation Physics and Chemistry","volume":"229 ","pages":"Article 112480"},"PeriodicalIF":2.8000,"publicationDate":"2024-12-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Analysis of Cd and Ag clusters by concurrent standard and high-resolution micro-PIXE spectroscopy\",\"authors\":\"Iva Božičević Mihalić , Anja Mioković , Masedi Carington Masekane , Stjepko Fazinić\",\"doi\":\"10.1016/j.radphyschem.2024.112480\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Particle Induced X-ray Emission (PIXE) spectroscopy is now a mainstay in Ion Beam Analysis (IBA) and is applicable across several scientific disciplines requiring high sensitivity for detecting constituent elements in a material. While the technique is well established, the use of conventional broad-band spectrometers limits the ability for X-ray line separation for closely lying characteristic energies. The inability to separate closely lying X-ray lines using standard silicon detectors with resolution >120 eV FWHM (for Mn Kα) especially hinders quantitation in varying applications. One such limitation is the separation of Ag and Cd L-shell X-ray lines, the extraction of which is often needed for accurate concentration measurements. While this limitation may be circumvented by using higher proton energies (>15 MeV) for Ag and Cd K-shell excitation, accurate computation may still be constrained by the lack of X-ray production cross section data, as cross sections predicted by theory are only widely validated up to 3 MeV. The present work demonstrates a simultaneous use of high-resolution and standard PIXE spectroscopy using 2 MeV proton beams for the measurement of relative Ag and Cd L-shell concentration ratios, along with the use of multivariate analysis of PIXE spectral images. Ag and Cd concentration ratios analysed using GUPIXWIN for standard PIXE and a Wavelength Dispersive X-ray Spectrometer (WDX) are compared and discussed.</div></div>\",\"PeriodicalId\":20861,\"journal\":{\"name\":\"Radiation Physics and Chemistry\",\"volume\":\"229 \",\"pages\":\"Article 112480\"},\"PeriodicalIF\":2.8000,\"publicationDate\":\"2024-12-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Radiation Physics and Chemistry\",\"FirstCategoryId\":\"92\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0969806X24009721\",\"RegionNum\":3,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"CHEMISTRY, PHYSICAL\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Radiation Physics and Chemistry","FirstCategoryId":"92","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0969806X24009721","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"CHEMISTRY, PHYSICAL","Score":null,"Total":0}
引用次数: 0
摘要
粒子诱导x射线发射(PIXE)光谱现在是离子束分析(IBA)的支柱,适用于需要高灵敏度检测材料成分元素的几个科学学科。虽然这项技术已经很好地建立起来,但使用传统的宽带光谱仪限制了x射线线分离接近的特征能量的能力。使用分辨率为120 eV FWHM(用于Mn Kα)的标准硅探测器无法分离紧密的x射线线,这尤其阻碍了不同应用中的定量。其中一个限制是银和镉l -壳层x射线线的分离,精确的浓度测量通常需要提取它们。虽然这一限制可以通过使用更高的质子能量(>15 MeV)来激发Ag和Cd k壳层来规避,但由于缺乏x射线产生截面数据,精确的计算可能仍然受到限制,因为理论预测的截面仅在3 MeV以下得到广泛验证。目前的工作展示了同时使用高分辨率和标准的pxie光谱,使用2 MeV质子束来测量相对Ag和Cd的l -壳浓度比,以及使用pxie光谱图像的多元分析。用GUPIXWIN对标准x射线光谱仪和波长色散x射线光谱仪(WDX)分析银和镉的浓度比进行了比较和讨论。
Analysis of Cd and Ag clusters by concurrent standard and high-resolution micro-PIXE spectroscopy
Particle Induced X-ray Emission (PIXE) spectroscopy is now a mainstay in Ion Beam Analysis (IBA) and is applicable across several scientific disciplines requiring high sensitivity for detecting constituent elements in a material. While the technique is well established, the use of conventional broad-band spectrometers limits the ability for X-ray line separation for closely lying characteristic energies. The inability to separate closely lying X-ray lines using standard silicon detectors with resolution >120 eV FWHM (for Mn Kα) especially hinders quantitation in varying applications. One such limitation is the separation of Ag and Cd L-shell X-ray lines, the extraction of which is often needed for accurate concentration measurements. While this limitation may be circumvented by using higher proton energies (>15 MeV) for Ag and Cd K-shell excitation, accurate computation may still be constrained by the lack of X-ray production cross section data, as cross sections predicted by theory are only widely validated up to 3 MeV. The present work demonstrates a simultaneous use of high-resolution and standard PIXE spectroscopy using 2 MeV proton beams for the measurement of relative Ag and Cd L-shell concentration ratios, along with the use of multivariate analysis of PIXE spectral images. Ag and Cd concentration ratios analysed using GUPIXWIN for standard PIXE and a Wavelength Dispersive X-ray Spectrometer (WDX) are compared and discussed.
期刊介绍:
Radiation Physics and Chemistry is a multidisciplinary journal that provides a medium for publication of substantial and original papers, reviews, and short communications which focus on research and developments involving ionizing radiation in radiation physics, radiation chemistry and radiation processing.
The journal aims to publish papers with significance to an international audience, containing substantial novelty and scientific impact. The Editors reserve the rights to reject, with or without external review, papers that do not meet these criteria. This could include papers that are very similar to previous publications, only with changed target substrates, employed materials, analyzed sites and experimental methods, report results without presenting new insights and/or hypothesis testing, or do not focus on the radiation effects.