{"title":"基于约束缩放的场景控制系统设计降低样本复杂度","authors":"Jaeseok Choi;Anand Deo;Constantino Lagoa;Anirudh Subramanyam","doi":"10.1109/LCSYS.2024.3515861","DOIUrl":null,"url":null,"abstract":"The scenario approach is widely used in robust control system design and chance-constrained optimization, maintaining convexity without requiring assumptions about the probability distribution of uncertain parameters. However, the approach can demand large sample sizes, making it intractable for safety-critical applications that require very low levels of constraint violation. To address this challenge, we propose a novel yet simple constraint scaling method, inspired by large deviations theory. Under mild nonparametric conditions on the underlying probability distribution, we show that our method yields an exponential reduction in sample size requirements for bilinear constraints with low violation levels compared to the classical approach, thereby significantly improving computational tractability. Numerical experiments on robust pole assignment problems support our theoretical findings.","PeriodicalId":37235,"journal":{"name":"IEEE Control Systems Letters","volume":"8 ","pages":"2793-2798"},"PeriodicalIF":2.4000,"publicationDate":"2024-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Reduced Sample Complexity in Scenario-Based Control System Design via Constraint Scaling\",\"authors\":\"Jaeseok Choi;Anand Deo;Constantino Lagoa;Anirudh Subramanyam\",\"doi\":\"10.1109/LCSYS.2024.3515861\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The scenario approach is widely used in robust control system design and chance-constrained optimization, maintaining convexity without requiring assumptions about the probability distribution of uncertain parameters. However, the approach can demand large sample sizes, making it intractable for safety-critical applications that require very low levels of constraint violation. To address this challenge, we propose a novel yet simple constraint scaling method, inspired by large deviations theory. Under mild nonparametric conditions on the underlying probability distribution, we show that our method yields an exponential reduction in sample size requirements for bilinear constraints with low violation levels compared to the classical approach, thereby significantly improving computational tractability. Numerical experiments on robust pole assignment problems support our theoretical findings.\",\"PeriodicalId\":37235,\"journal\":{\"name\":\"IEEE Control Systems Letters\",\"volume\":\"8 \",\"pages\":\"2793-2798\"},\"PeriodicalIF\":2.4000,\"publicationDate\":\"2024-12-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Control Systems Letters\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10793422/\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"AUTOMATION & CONTROL SYSTEMS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Control Systems Letters","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/10793422/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"AUTOMATION & CONTROL SYSTEMS","Score":null,"Total":0}
Reduced Sample Complexity in Scenario-Based Control System Design via Constraint Scaling
The scenario approach is widely used in robust control system design and chance-constrained optimization, maintaining convexity without requiring assumptions about the probability distribution of uncertain parameters. However, the approach can demand large sample sizes, making it intractable for safety-critical applications that require very low levels of constraint violation. To address this challenge, we propose a novel yet simple constraint scaling method, inspired by large deviations theory. Under mild nonparametric conditions on the underlying probability distribution, we show that our method yields an exponential reduction in sample size requirements for bilinear constraints with low violation levels compared to the classical approach, thereby significantly improving computational tractability. Numerical experiments on robust pole assignment problems support our theoretical findings.