X17AG18钢和ZrC陶瓷二次电子能谱配准方法及原子电子结构的实验研究

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
I. A. Shulepov, E. S. Mirovaya, A. A. Neiman, S. P. Buyakova, L. B. Botaeva
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引用次数: 0

摘要

概述了电子能谱在固体物理化学性质研究中的应用。值得注意的是,关于原子电子态的信息的主要来源是离子、x射线量子和激光束激发的电子的能量分布。本文简要讨论了用介质能量(1 - 20kev)的电子激发样品表面得到的二次电子谱在登记中存在的问题及解决这些问题的方法,以提高研究结果的信息量和准确性。提出了一种利用俄歇能谱仪以积分形式记录二次电子能谱的方法,从而提高了该方法的能量分辨率。通过对碳化锆和X17AG18钢的实验研究,验证了该方法的可行性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

Registration Method of Secondary Electron Spectra and Experimental Studies of the Electronic Structure of Atoms of Steel X17AG18 and ZrC Ceramics

Registration Method of Secondary Electron Spectra and Experimental Studies of the Electronic Structure of Atoms of Steel X17AG18 and ZrC Ceramics

An overview of the use of electron spectroscopy for the study of the physicochemical properties of solids is carried out. It is noted that the main source of information about the electronic states of atoms is the energy distribution of electrons excited by ions, X-ray quanta, and laser beams. The paper briefly discusses the problems that exist in registering the spectra of secondary electrons obtained by exciting the surface of samples with electrons of medium (1–20 keV) energies and ways to solve these problems in order to increase the information content and accuracy of research results. A method for recording secondary electron spectra in an integral form using an Auger spectrometer is proposed, which allows one to increase the energy resolution of the method. The possibilities of the method are demonstrated by the example of experimental studies of zirconium carbide and steel X17AG18.

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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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