利用电子束处理在 Kh12MF 钢表面形成基于硼化铬的保护层

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
A. S. Milonov, U. L. Mishigdorzhiyn, A. P. Semenov, S. A. Lysykh
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引用次数: 0

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Formation of a Protective Layer Based on Chromium Boride on the Surface of Kh12MF Steel Using Electron-Beam Treatment

Formation of a Protective Layer Based on Chromium Boride on the Surface of Kh12MF Steel Using Electron-Beam Treatment

The preparation of coating layers containing the borides Cr2B, Cr2B3, and FeB on Kh12MF steel using the electron-beam treatment of reacting coatings made of Cr2O3, amorphous boron, and carbon is considered. The influence of the treatment time on the structure, composition, and microhardness of the layers is investigated. The maximum microhardness of the layers is ~18.5 GPa. The studies allow one to conclude that electron-beam treatment can be used to strengthen cutting and other tools, which experience high temperature heating during operation, without a significant reduction in performance. It is known that, along with high hardness and wear resistance, boride layers also have a significant disadvantage: increased brittleness. The studies carried out show that the use of electronic heating allows a reduction in brittleness and increase in plasticity of the alloys. The layers after electron-beam boriding have a heterogeneous structure combining hard (brittle) and more plastic structural components.

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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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