干涉仪块的机械损伤对其 X 射线衍射图样的影响

IF 0.5 Q4 PHYSICS, CONDENSED MATTER
H. R. Drmeyan, S. B. Dabagov, H. G. Margaryan, S. A. Mkhiraryan
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引用次数: 0

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Influence of Mechanical Damage to an Interferometer Block on Its X-Ray Diffraction Pattern

Influence of Mechanical Damage to an Interferometer Block on Its X-Ray Diffraction Pattern

This study examines the impact of mechanical damage to an X-ray interferometer block on its observed X-ray diffraction pattern. The origin of contrast resulting from imperfections in the crystal structure of the interferometer block, which arises from mechanical damage, is interpreted. Both theoretical and experimental evidence demonstrates that the curvature of interference fringes in the Moiré topogram is a result of scratches on the surface of the crystal block of the X-ray interferometer. The study determines the relationship between the period of the Moiré fringes, dislocation density, and their displacement. The average dislocation density near the center of the scratch is calculated. The study shows that the period of the Moiré pattern is inversely proportional to the dislocation density. Experimental evidence demonstrates that changes in the Moiré pattern also occur in the presence of dislocations in the crystal, which form as a result of a scratch on the surface of the crystal block of the X-ray interferometer. The geometric parameters of the scratch on the surface of the interferometer’s crystal block are determined. The depth of the scratch and the extent of the dislocation group aligned along the scratch are calculated.

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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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