相位搅拌混响室内MIMO性能及不确定度分析

IF 2 3区 计算机科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Yifan Wang;Hanzhi Ma;Gangzha Liu;Er-Ping Li
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摘要

本文章由计算机程序翻译,如有差异,请以英文原文为准。
MIMO Performance and Uncertainty Analysis in a Reverberation Chamber With Phase Stirring
Source-stirred reverberation chamber (SSRC) is a typical type of reverberation chambers (RCs) that can produce an electromagnetic environment suitable for electromagnetic compatibility (EMC) testing without a mechanical stirrer. This article proposes an SSRC based on phased array antennas, which achieves stirring by changing the phase difference, helping to improve test efficiency and reduce costs. The stirring effects and the multiple-input multiple-output (MIMO) performance of SSRC is investigated, with a focus on the measurement and uncertainty analysis of the Rician K-factor. The results demonstrate that the phase stirring method can achieve sufficient stirring. Moreover, four sample selection methods are employed to evaluate the measurement uncertainty. It is found that the correlation matrix method yielding the smallest relative uncertainty among them, approximately 1.2$\%$ at 10 GHz. Through a uniformity and MIMO performance test, this article demonstrates the potential of phase stirring technology in EMC and MIMO over-the-air testing, providing a significant option for improving efficiency and reducing costs.
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来源期刊
CiteScore
4.80
自引率
19.00%
发文量
235
审稿时长
2.3 months
期刊介绍: IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.
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