基于深度学习的印刷电路板辐射发射智能预测方法

IF 2 3区 计算机科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Kai Wei;Dan Shi;Chengyu Li;Yanchi Liu;Na Sun;Dan Xiao;Xingguo Jiang
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引用次数: 0

摘要

本文介绍了一种新的深度学习方法,利用seq2seq模型来预测高密度、多层和复杂印刷电路板(pcb)中的远场辐射发射(REs)。为了解决在复杂pcb的RE预测中由过长的网络序列引起的弱长期依赖性和信息模糊性的挑战,我们的方法首先对每个网络组合进行标记和建模。然后将这些组合输入seq2seq模型进行训练,并辅以多头注意机制来增强信息连通性。为了验证模型的准确性和效率,我们将模型的预测结果与传统的全波电磁模拟结果进行了比较。我们的方法显著地将整个电路板的RE预测时间从几个小时减少到近一秒。此外,该模型在RE预测中表现出很高的性能,平均绝对误差约为0.001 V/m。为了验证模型的可靠性,我们将训练好的模型应用于预测全新整个电路板和关键网络的RE,证明其能够准确预测以前未见过的pcb的RE。因此,该方法在实际应用中可以实现智能化、全自动的RE预测。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Intelligent Prediction Method for Radiation Emission of Printed Circuit Board by Using Deep Learning
This article introduces a novel deep learning approach, utilizing a seq2seq model, to predict far-field radiation emissions (REs) in high-density, multilayer, and complex printed circuit boards (PCBs). To address the challenges of weak long-term dependencies and information ambiguity arising from excessively long network sequences in RE prediction for complex PCBs, our method begins by tokenizing and modeling each network combination. These combinations are then fed into the seq2seq model for training, supplemented with a multihead attention mechanism to enhance information connectivity. To validate the model's accuracy and efficiency, we compared our prediction results with those obtained from traditional full-wave electromagnetic simulations. Our approach significantly reduces the RE prediction time for the entire board from several hours to nearly one second. Moreover, the model exhibits high performance in RE prediction, with a mean absolute error of approximately 0.001 V/m. To verify the model's reliability, we applied the trained model to predict RE for brand-new entire boards and key networks, demonstrating its ability to accurately predict RE in previously unseen PCBs. Therefore, this method can be implemented for intelligent, full-automatic RE prediction in practical applications.
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来源期刊
CiteScore
4.80
自引率
19.00%
发文量
235
审稿时长
2.3 months
期刊介绍: IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.
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