一种用于28纳米CMOS存储器接口的64 Gb/s/引脚单端PAM-4发送器及其合并预强调电容峰值串扰消除方案

IF 4.6 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
Weitao Wu;Hongzhi Wu;Liping Zhong;Xuxu Cheng;Xiongshi Luo;Dongfan Xu;Catherine Wang;Zhenghao Li;Quan Pan
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引用次数: 0

摘要

本文章由计算机程序翻译,如有差异,请以英文原文为准。
A 64 Gb/s/pin Single-Ended PAM-4 Transmitter With a Merged Preemphasis Capacitive-Peaking Crosstalk Cancellation Scheme for Memory Interfaces in 28-nm CMOS
A 64 Gb/s/pin single-ended four-level pulse amplitude modulation (PAM-4) transmitter (TX) incorporating a merged preemphasis capacitive-peaking (C-peaking) crosstalk cancellation (XTC) scheme and a 3-tap reconfigurable fractional-spaced feed-forward equalizer (FS-FFE) is presented. The proposed XTC scheme mitigates the far-end crosstalk (FEXT) without attenuating the output swing while maintaining high TX’s bandwidth. The proposed FS-FFE provides a compensation range beyond Nyquist frequency, thereby reducing the switching jitter (SWJ) and extending the widths of PAM-4 eyes. The reconfigurable feed-forward equalizer (FFE) tap assignment scheme enables the TX to operate in a wider range of scenarios without additional power consumption. Besides, the FFE) coefficient selector in the predriver eliminates the need for additional driver cells typically required by FFE taps, reducing parasitic capacitance at the TX output and further improving the TX bandwidth by 60%. The measurement results show that the TX achieves an energy efficiency of 1.27 pJ/bit at 64 Gb/s with a total insertion loss of −11 dB and FEXT of −15.8 dB at 16 GHz. The proposed merged C-peaking XTC scheme decreases the crosstalk-induced jitter (CIJ) ratio by 82%.
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来源期刊
IEEE Journal of Solid-state Circuits
IEEE Journal of Solid-state Circuits 工程技术-工程:电子与电气
CiteScore
11.00
自引率
20.40%
发文量
351
审稿时长
3-6 weeks
期刊介绍: The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.
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