多缝极小角中子散射仪的涂抹函数

IF 5.2 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY
Zehua Han, Changli Ma, Hong Zhu, Tengfei Cui, Taisen Zuo, He Cheng
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引用次数: 0

摘要

除了传统的针孔几何结构外,中国散裂中子源的多缝极小角中子散射仪(MS-VSANS)还采用了多缝准直系统来聚焦中子。采用特殊的聚焦结构,最小散射矢量大小(q)可达到0.00028 Å−1。特殊的结构也导致了明显不同的涂抹功能。通过理论计算结果与实验数据的对比,验证了基于成熟的狭缝涂抹理论的涂抹方法的可行性。我们使用中子波长的加权平均强度作为代表来评估宽波长分布的影响,重点关注多缝结构和探测器几何形状的影响。对一系列不同直径聚苯乙烯标准材料的VSANS散射曲线,理论计算结果与实验结果的一致性证明了该方法的可行性。这标志着采用多缝准直系统的仪器首次使用真实实验数据。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

The smearing function for a multi-slit very small angle neutron scattering instrument

The smearing function for a multi-slit very small angle neutron scattering instrument

Besides traditional pinhole geometry, the multi-slit very small angle neutron scattering instrument (MS-VSANS) at the China Spallation Neutron Source also utilizes a multi-slit collimation system to focus neutrons. Using the special focusing structures, the minimum scattering vector magnitude (q) can reach 0.00028 Å−1. The special structures also lead to a significantly different smearing function. By comparing the results of theoretical calculations with experimental data, we have validated the feasibility of a smearing method based on a mature theory for slit smearing. We use the weight-averaged intensity of neutron wavelength as a representative to evaluate the effect from a broad wavelength distribution, concentrating on the effect from the geometry of the multi-slit structures and the detector. The consistency of the theoretical calculation of the smearing function with experimental VSANS scattering profiles for a series of polystyrene standards of different diameters proves the feasibility of the smearing method. This marks the inaugural use of real experimental data from an instrument employing a multi-slit collimation system.

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来源期刊
Journal of Applied Crystallography
Journal of Applied Crystallography CHEMISTRY, MULTIDISCIPLINARYCRYSTALLOGRAPH-CRYSTALLOGRAPHY
CiteScore
7.80
自引率
3.30%
发文量
178
期刊介绍: Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.
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