基于 VAE 的用于 PCB 轮廓测量的 3D 图像修复方法

IF 2.1 4区工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Photonics Journal Pub Date : 2024-11-04 DOI:10.1109/JPHOT.2024.3492026

Min-Ho Ha;Saba Arshad;Tae-Jung Kim;Tae-Hyoung Park

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引用次数: 0

摘要

本文的重点是印刷电路板元件的三维测量系统。大多数自动光学检测都会受到被元件遮挡的阴影和反射的影响。我们提出了一种恢复元件阴影和反射区域以实现精确形状测量的新方法。该区域通过基于变异自动编码器的还原网络进行还原。输入阴影和反射区域的信息来还原区域是非常有效的。此外，VAE 还添加了长跳接，以提高准确性。我们通过实验证实了它的优越性，并将其性能与其他修复网络（如循环生成对抗网络和相干语义注意涂色）进行了比较。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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VAE-Based 3D Image Restoration Method for PCB Profilometry

This paper focuses on three-dimensional measurement system of printed circuit board components. Most automated optical inspections suffer from shadows and reflections obscured by the components. We propose a new method to restore shadow and reflection regions of components for accurate shape measurements, which defines shadow and reflection regions for restoration. The region is restored with a variational auto encoder-based restoration network. It is efficient to input information about both shadow and reflection region to restore the region. Additionally, long skip connection is added to VAE for improved accuracy. We confirmed its superiority through experiments by comparing its performance with other restoration networks such as cycle generative adversarial networks and coherent semantic attention inpainting.

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来源期刊

IEEE Photonics Journal ENGINEERING, ELECTRICAL & ELECTRONIC-OPTICS

CiteScore

4.50

自引率

8.30%

发文量

489

审稿时长

1.4 months

期刊介绍： Breakthroughs in the generation of light and in its control and utilization have given rise to the field of Photonics, a rapidly expanding area of science and technology with major technological and economic impact. Photonics integrates quantum electronics and optics to accelerate progress in the generation of novel photon sources and in their utilization in emerging applications at the micro and nano scales spanning from the far-infrared/THz to the x-ray region of the electromagnetic spectrum. IEEE Photonics Journal is an online-only journal dedicated to the rapid disclosure of top-quality peer-reviewed research at the forefront of all areas of photonics. Contributions addressing issues ranging from fundamental understanding to emerging technologies and applications are within the scope of the Journal. The Journal includes topics in: Photon sources from far infrared to X-rays, Photonics materials and engineered photonic structures, Integrated optics and optoelectronic, Ultrafast, attosecond, high field and short wavelength photonics, Biophotonics, including DNA photonics, Nanophotonics, Magnetophotonics, Fundamentals of light propagation and interaction; nonlinear effects, Optical data storage, Fiber optics and optical communications devices, systems, and technologies, Micro Opto Electro Mechanical Systems (MOEMS), Microwave photonics, Optical Sensors.