利用脉冲腔环降技术精确测量光学块体材料的损耗。

IF 3.2 2区 物理与天体物理 Q2 OPTICS
Optics express Pub Date : 2024-11-04 DOI:10.1364/OE.537747
Binghua Cai, Bincheng Li, Yaowei Wei, Yanling Han, Tianmin Wang, Jing Wang, Hao Cui
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引用次数: 0

摘要

在广泛的激光应用中,激光系统中使用的光学材料的光学损耗与激光引起的损伤和激光光束质量下降密切相关。本文证明,当采用脉冲腔降环(CRD)技术测量以正常入射方式插入降环腔中的未涂层基底的光学损耗时,未涂层基底的表面反射会导致光学损耗被明显高估。随着表面反射率的增加,高估程度也迅速增加。考虑到表面反射对测量的 CRD 信号的影响,以及测量损耗与实际损耗的近似线性关系,可以根据测量损耗准确确定固体基底的实际损耗。通过理论描述,建立了 CRD 测量损耗与实际损耗之间的简单关系,从而消除了表面反射对光学损耗测量的影响。实验结果表明,厚度为 10 毫米的熔融石英和 KDP 基底在 355 纳米波长下的光损耗分别为 116ppm 和 567ppm。结果表明,脉冲 CRD 可以准确测定低于分光光度法测量极限(∼3000 ppm)的光学损耗。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Accurate loss measurement of optical bulk materials with the pulsed cavity ring-down technique.

In a wide range of laser applications, the optical losses of optical materials used in the laser systems are closely linked to the laser-induced damage and laser beam quality deterioration. It is demonstrated in this paper that when the pulsed cavity ring-down (CRD) technique is employed to measure the optical loss of uncoated substrates inserted in the ring-down cavity with normal incidence, the surface reflection of the uncoated substrate causes a significant overestimation of the optical loss. The degree of overestimation increases rapidly with the increasing surface reflectance. By taking into consideration the influence of the surface reflection on the measured CRD signal and developing an approximately linear dependence of the measured loss on the actual loss, the actual loss of the solid substrate is determined accurately from the measured loss. A theoretical description is developed to establish a simple relationship between the CRD measured loss and the actual loss, so to eliminate the influence of the surface reflection on the optical loss measurement. Experimentally the optical losses of fused silica and KDP substrates with 10 mm thickness at 355 nm are determined to be 116 parts per million (ppm) and 567 ppm, respectively. The results demonstrate the usefulness of pulsed CRD for accurate determination of optical loss below the measurement limit (∼3000 ppm) of spectrophotometry.

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来源期刊
Optics express
Optics express 物理-光学
CiteScore
6.60
自引率
15.80%
发文量
5182
审稿时长
2.1 months
期刊介绍: Optics Express is the all-electronic, open access journal for optics providing rapid publication for peer-reviewed articles that emphasize scientific and technology innovations in all aspects of optics and photonics.
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