纳米裂缝柔电性的尺寸依赖性

IF 3.5 2区 物理与天体物理 Q2 PHYSICS, APPLIED
Yihan Hao, Mengkang Xu, Xinpeng Tian, Qian Deng
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引用次数: 0

摘要

挠电效应是应变梯度与电极化之间的一种机电耦合,对于纳米级结构尤为重要。由于应变梯度随样品特征尺寸的减小而增大,因此挠电效应与尺寸有关。由于应力集中,裂纹尖端会出现较大的应变梯度,从而产生显著的挠电效应。然而,对于微米级或纳米级裂纹,挠电效应如何随裂纹尺寸变化还不清楚。实际上,裂纹尖端的半径是有限的。因此,除裂纹长度外,裂纹尖端半径也是描述纳米裂纹尺寸的几何参数之一。在这项工作中,我们使用配位混合有限元法(CMFEM),通过这两个参数研究了纳米裂纹周围挠电性的尺寸依赖性。数值模拟结果表明,无论是较大的裂纹长度还是较小的裂纹尖端半径,都能在裂纹尖端周围形成较强的挠电场。我们还分析了裂纹长度和尖端半径的相互作用,并展示了当这两个参数都发生变化时,裂纹尖端挠电场是如何变化的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The size dependence of flexoelectricity at nanocracks
The flexoelectric effect is an electro-mechanical coupling between strain gradients and the electric polarization, and it is especially significant for nanoscale structures. Since the strain gradient scales up with the decrease in the sample's feature size, the flexoelectric effect is size dependent. Due to the stress concentration, large strain gradients can be found at the crack tip and result in significant flexoelectric effect. However, for micro- or nanoscale cracks, it is still not clear how the flexoelectric effect changes with the size of cracks. In practice, the crack tip has finite radius. So, in addition to the crack length, the crack tip radius is also one of the geometric parameters describing the size of nanocracks. In this work, using our collocation mixed finite element method (CMFEM), we study the size dependence of flexoelectricity around nanocracks through these two parameters. Numerical simulation results indicate that stronger flexoelectric field can be formed around the tip of cracks with either larger crack length or smaller tip radius. We also analyze the interplay of the crack length and the tip radius and show how the crack tip flexoelectric field varies when both of these two parameters are changing.
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来源期刊
Applied Physics Letters
Applied Physics Letters 物理-物理:应用
CiteScore
6.40
自引率
10.00%
发文量
1821
审稿时长
1.6 months
期刊介绍: Applied Physics Letters (APL) features concise, up-to-date reports on significant new findings in applied physics. Emphasizing rapid dissemination of key data and new physical insights, APL offers prompt publication of new experimental and theoretical papers reporting applications of physics phenomena to all branches of science, engineering, and modern technology. In addition to regular articles, the journal also publishes invited Fast Track, Perspectives, and in-depth Editorials which report on cutting-edge areas in applied physics. APL Perspectives are forward-looking invited letters which highlight recent developments or discoveries. Emphasis is placed on very recent developments, potentially disruptive technologies, open questions and possible solutions. They also include a mini-roadmap detailing where the community should direct efforts in order for the phenomena to be viable for application and the challenges associated with meeting that performance threshold. Perspectives are characterized by personal viewpoints and opinions of recognized experts in the field. Fast Track articles are invited original research articles that report results that are particularly novel and important or provide a significant advancement in an emerging field. Because of the urgency and scientific importance of the work, the peer review process is accelerated. If, during the review process, it becomes apparent that the paper does not meet the Fast Track criterion, it is returned to a normal track.
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