用于准确检测 PCB 缺陷的自适应缺陷感知注意力网络

IF 5.6 2区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC
Xiang Liu
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引用次数: 0

摘要

缺陷检测是印刷电路板(PCB)制造过程中质量控制的重要组成部分。然而,由于印刷电路板缺陷非常小且不明显,因此准确检测印刷电路板缺陷具有挑战性。本文提出了一种用于 PCB 缺陷检测的自适应缺陷感知注意力网络(ADANet),它包含两个主要模块:小缺陷保存与定位(SDPL)和缺陷分割预测(DSP),其中 SDPL 模块旨在提取高分辨率和多尺度缺陷特征表征,以避免模型深度造成的小缺陷损失,然后利用可变形变压器定位其位置,而 DSP 模块则用于预测其类别和掩膜。在两个印刷电路板数据集上进行的实验结果表明,所提出的 ADANet 可以超越最先进的方法,在多尺度缺陷分类和检测结果方面实现高性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
An Adaptive Defect-Aware Attention Network for Accurate PCB-Defect Detection
Defect detection is a critical component of quality control in the manufacturing of printed circuit boards (PCBs). However, accurately detecting PCB defects is challenging because they are very small and inconspicuous. In this article, an adaptive defect-aware attention network (ADANet) is proposed for PCB defect detection, and it contains two main modules: small defect preserving and location (SDPL) and defect segmentation prediction (DSP), where the SDPL module is designed to extract the high-resolution and multiscale defect feature representations to avoid the loss of small defects caused by model depth and then locate their positions with a deformable Transformer, and the DSP module is developed to predict their categories and masks. Experimental results conducted on two PCB datasets show that the proposed ADANet can surpass state-of-the-art approaches and achieve high performance in multiscale defect classification and detection results.
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来源期刊
IEEE Transactions on Instrumentation and Measurement
IEEE Transactions on Instrumentation and Measurement 工程技术-工程:电子与电气
CiteScore
9.00
自引率
23.20%
发文量
1294
审稿时长
3.9 months
期刊介绍: Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.
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