Shupeng Liu , Ali B.M. Ali , Muntadher Abed Hussein , Anjan Kumar , Dilsora Abduvalieva , Hadeel Kareem Abdul-Redha , Soheil Salahshour , Nafiseh Emami
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The results indicate that the toughness decreased from 10.788 eV/Å<sup>3</sup> to 10.195 eV/Å<sup>3</sup> as the initial Temp increased to 500 K. Additionally, MSD and diffusion coefficient of porous silicon sample increased from 3.88 nm<sup>2</sup> and 27.86 nm<sup>2</sup>/ns to 8.67 nm2 and 75.56 nm<sup>2</sup>/ns when the Temp increased from 300 K to 500 K. As the Temp increases to 500 K, the COM increases from 0.236 to 0.41 Å. The total energy of system decreases to −29,259.648 eV when the initial Temp of the porous silicon sample increases to 500 K. Changes in the atomic-scale dynamics and the structural properties of porous silicon network were responsible for this tendency. This study's novelty lies in its focus on the unknown relationship between Temp and porous silicon performance. The results of this study indicate that the Temp had a significant effect on the mechanical and thermal properties of porous silicon samples. 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引用次数: 0
摘要
本研究考察了多孔硅样品的机械性能和热性能与其初始温度(Temp)的关系。采用分子动力学(MD)数值模拟方法对结果进行分析,并使用 LAMMPS 软件对多孔样品进行建模。本研究中进行的模拟预测了所建模的多孔硅样品的物理平衡。研究结果表明,当温度从 300 K 上升到 500 K 时,多孔结构的极限强度和杨氏模量分别从 26.559 和 52.484 GPa 下降到 25.830 和 52.304 GPa。当温度从 300 K 升至 500 K 时,多孔硅样品的 MSD 和扩散系数分别从 3.88 nm2 和 27.86 nm2/ns 增至 8.67 nm2 和 75.56 nm2/ns。这项研究的新颖之处在于它关注温度与多孔硅性能之间的未知关系。研究结果表明,温度对多孔硅样品的机械性能和热性能有显著影响。这些发现对于推动多孔硅在各个技术领域的实际应用是非常必要的,特别是在对温度敏感的应用领域,了解多孔硅在不同热条件下的行为非常重要。
Numerical study of changes in the mechanical and thermal property of porous silicon sample with increasing initial temperature: A molecular dynamics approach
The mechanical and thermal properties of porous silicon samples were examined in this investigation in relation to their initial temperature (Temp). The molecular dynamics (MD) numerical simulation method was employed to analyze the results, and LAMMPS software was used to model the porous sample. The simulations conducted in the present study predicted the physical equilibrium of porous silicon samples that were modeled. The research results indicate that the ultimate strength and Young's modulus of porous structures decreased from 26.559 and 52.484 GPa to 25.830 and 52.304 GPa as the Temp increased from 300 to 500 K. The results indicate that the toughness decreased from 10.788 eV/Å3 to 10.195 eV/Å3 as the initial Temp increased to 500 K. Additionally, MSD and diffusion coefficient of porous silicon sample increased from 3.88 nm2 and 27.86 nm2/ns to 8.67 nm2 and 75.56 nm2/ns when the Temp increased from 300 K to 500 K. As the Temp increases to 500 K, the COM increases from 0.236 to 0.41 Å. The total energy of system decreases to −29,259.648 eV when the initial Temp of the porous silicon sample increases to 500 K. Changes in the atomic-scale dynamics and the structural properties of porous silicon network were responsible for this tendency. This study's novelty lies in its focus on the unknown relationship between Temp and porous silicon performance. The results of this study indicate that the Temp had a significant effect on the mechanical and thermal properties of porous silicon samples. These findings are necessary to advance the practical use of porous silicon in various technological fields, especially in Temp-sensitive applications, where understanding its behavior under different thermal conditions is very important.
期刊介绍:
International Communications in Heat and Mass Transfer serves as a world forum for the rapid dissemination of new ideas, new measurement techniques, preliminary findings of ongoing investigations, discussions, and criticisms in the field of heat and mass transfer. Two types of manuscript will be considered for publication: communications (short reports of new work or discussions of work which has already been published) and summaries (abstracts of reports, theses or manuscripts which are too long for publication in full). Together with its companion publication, International Journal of Heat and Mass Transfer, with which it shares the same Board of Editors, this journal is read by research workers and engineers throughout the world.