研究 HPM 脉冲宽度和重复频率对 AAV 的影响

IF 2 3区 计算机科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Zhao Zhang;Yang Zhou;Yang Zhang;Baoliang Qian
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引用次数: 0

摘要

大功率微波会影响电子设备或系统的正常工作,而这种影响与微波脉冲的参数有关。据我们所知,目前还没有关于HPM脉冲宽度和重复频率对自主飞行器(AAV)系统影响的研究报道。脉冲宽度和重复频率对电子系统电磁耦合影响的机理尚不清楚。为此,本文以典型的AAV系统为例,研究了c波段HPM脉冲宽度和重复频率对其的影响。对AAV进行了HPM辐照试验,发现GPS接收机、数据链和飞控模块容易受到影响,不能正常工作。此外,测试结果表明,随着脉冲宽度和重复频率的增加,敏感器件受到影响的概率增大。此外,对HPM辐照下的飞控模块进行了仿真研究,发现连接飞控电路的电缆上可能耦合电压脉冲,影响电路的正常工作。为了进一步研究脉冲宽度和重复频率的影响机理,建立了等效电路模型。观察到,随着干扰信号脉冲宽度的增大和重复频率的提高,敏感器件负载上的电压增大。这导致设备更容易受到影响,这与测试结果一致。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Investigation on the Effect of HPM Pulse Width and Repetition Frequency on the AAV
High-power microwave (HPM) affects the normal operation of electronic devices or systems, and the effects are related to the parameters of the microwave pulse. To the best of our knowledge, there are no reported studies on the effect of HPM pulse width and repetition frequency on the autonomous aerial vehicles (AAV) system. The mechanism of the effect of pulse width and repetition frequency on the electromagnetic coupling of electronic systems is unclear. For this reason, this article takes the typical AAV system as the example and investigates the effect of C-band HPM pulse width and repetition frequency on it. HPM irradiation tests on the AAV are carried out and it is found that the GPS receiver, datalink and flight control module are susceptible to be affected and fail to operate normally. In addition, the test results show that the probability of the sensitive device being affected increases with the increase of pulse width and repetition frequency. Moreover, a simulation study of the flight control module subjected to HPM irradiation is conducted and it is found that voltage pulses can be coupled to the cable connected to the flight control circuits, which may affect the normal operation of the circuits. In order to further investigate the mechanism of the effect of pulse width and repetition frequency, an equivalent circuit model is established. It is observed that the voltage across sensitive device loads increases with wider interference signal pulse and higher repetition frequency. This leads to the devices being more susceptible, which is consistent with the test results.
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来源期刊
CiteScore
4.80
自引率
19.00%
发文量
235
审稿时长
2.3 months
期刊介绍: IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.
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